Electronic probe shielding sample seat of radioactive sample
An electronic probe and radioactive technology, applied in shielding, nuclear power generation, climate sustainability, etc., can solve problems such as radioactive damage, achieve the effect of increasing control accuracy and improving microscopic analysis capabilities
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Embodiment 1
[0038] Such as Figure 1-Figure 2 As shown, an electronic probe shielding sample holder for a radioactive sample includes a sample stage chassis 9, an adjustable sample clamp 5 and a fixed sample clamp 7;
[0039] The fixed sample holder 7 and the adjustable sample holder 5 are arranged on the sample stage chassis 9, the fixed sample holder 7 and the adjustable sample holder 5 are arranged oppositely, and the fixed sample holder 7 and the adjustable sample holder 5 are formed An accommodating cavity for accommodating standard samples 11 and samples to be tested 12, the distance between the fixed sample holder 7 and the adjustable sample holder 5 can be adjusted;
[0040] The sample stage chassis 9, the adjustable sample fixture 5 and the fixed sample fixture 7 are all made of shielding materials; the shielding materials include stainless steel and tungsten-based materials, and the shielding ability of the shielding materials is not less than 5mm lead shielding equivalent.
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Embodiment 2
[0050] This embodiment is based on Embodiment 1, the horizontal section of the first L-shaped fixing plate 51 and the horizontal section of the second L-shaped fixing plate 71 respectively protrude inward to form a first boss and a second boss, so The first bosses and the second bosses are alternately arranged, a first accommodating cavity is formed between the first bosses and the second L-shaped fixing plate 71, and the gap between the second bosses and the first L-shaped fixing plate 51 A second accommodating cavity is formed between them, and the first accommodating cavity and the second accommodating cavity are used for placing the standard sample 11 and the sample to be tested 12 .
[0051] The test of the electronic probe in this embodiment requires that the shielded sample holder be provided with two sample mounting positions, one of which is used to place the sample to be tested 12 and the other to place the standard sample 11 .
Embodiment 3
[0053] This embodiment is based on Embodiment 1. A scale 10 is provided on the sample stage chassis 9 , and the length direction of the scale 10 is the displacement direction of the adjustable sample holder 5 .
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