Surface defect detection device and surface defect detection method

A defect detection and defect technology, applied in optical testing defects/defects, image analysis, instruments, etc., can solve problems such as poor product quality inspection effect, difficulty in accurately detecting surface defects, etc., to expand applicable scenarios, improve efficiency, The effect of expanding the scope of application

Inactive Publication Date: 2022-07-29
荣旗工业科技(苏州)股份有限公司
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Surface defect detection technology based on image analysis is difficult to accurately detect surface defects when targeting special detection scenarios such as arc-shaped surfaces or smooth surfaces, resulting in poor product quality inspection results

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  • Surface defect detection device and surface defect detection method
  • Surface defect detection device and surface defect detection method
  • Surface defect detection device and surface defect detection method

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Embodiment Construction

[0052] This specific embodiment is only an explanation of the application, and it does not limit the application. Those skilled in the art can make modifications to the embodiment without creative contribution as needed after reading this specification, but as long as the rights of the application are In order to make the purposes, technical solutions and advantages of the embodiments of the present application more clear, all of them are protected by the patent law within the scope of the requirements. Figure 1-3 , clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, but not all of the embodiments.

[0053] The embodiment of the present application provides a surface defect detection method, the method is implemented based on a surface defect detection device, the execution body may be an intelligent terminal, and the image acquisition...

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Abstract

The invention relates to the technical field of automatic detection equipment, in particular to a surface defect detection device and a surface defect detection method, and aims to solve the problems that in the prior art, when a surface defect detection technology based on image analysis is used for special detection scenes such as an arc-shaped surface or a smooth surface, surface defects are difficult to accurately detect, and the detection efficiency is high. According to the technical scheme, the surface defect detection device comprises an image acquisition device, a control terminal and a detection platform, the detection platform is used for placing a workpiece to be detected, the image acquisition device is controlled by the control terminal, and the image acquisition device comprises a lens and a grating. The optical grating is arranged between the lens and the detection platform and is used for generating moire features when the image acquisition device acquires the detection image of the defective workpiece to be detected, and the surface defect detection device has the effects of enlarging the applicable scene range of surface defect detection and improving the precision of surface defect detection.

Description

technical field [0001] The present application relates to the technical field of automatic detection equipment, and in particular, to a surface defect detection device and a surface defect detection method. Background technique [0002] Surface defect detection usually refers to the detection of surface defects of items, which is an important part of process production. Image processing and analysis is an important part of surface defect detection technology. An image can be regarded as a signal defined on a two-dimensional plane, and the amplitude of the signal corresponds to the grayscale of the pixel. If only a certain row of pixels in a frame of image is considered, it can be regarded as a one-dimensional space signal similar to the time domain signal, but the image signal is defined in the spatial domain. Therefore, the frequency of the image is called the spatial frequency, which refers to the number of periodic changes in the brightness per unit length, which reflec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G06T7/00G06T7/13G06T7/73
CPCG01N21/88G01N21/8851G06T7/0008G06T7/13G06T7/73G01N2021/8887G06T2207/10004G06T2207/30164
Inventor 朱文兵罗时帅钱曙光汪炉生柳洪哲柳云鸿钱根陶磊
Owner 荣旗工业科技(苏州)股份有限公司
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