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Line laser contourgraph point cloud calibration method and system based on plane calibration block

A calibration method and calibration block technology, which can be used in instruments, image analysis, calculations, etc., can solve the problems of low detection accuracy, distortion, target point cloud error, etc., and achieve the effect of improving detection accuracy.

Pending Publication Date: 2022-07-29
昂视智能(深圳)有限公司
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  • Application Information

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Problems solved by technology

Because the level of the laser emitted by the laser is reduced after being amplified, and there is theoretically irreversible distortion in the emitting lens and the receiving lens, resulting in a large error in the target point cloud, a large gap between the relative height information and the real value, and low detection accuracy

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  • Line laser contourgraph point cloud calibration method and system based on plane calibration block
  • Line laser contourgraph point cloud calibration method and system based on plane calibration block
  • Line laser contourgraph point cloud calibration method and system based on plane calibration block

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Embodiment Construction

[0045] In order to have a clearer understanding of the technical features, objects and effects of the present invention, the specific embodiments of the present invention will now be described in detail with reference to the accompanying drawings.

[0046] It should be noted that, the flowcharts shown in the accompanying drawings are only exemplary descriptions, and do not necessarily include all contents and operations / steps, and do not necessarily have to be executed in the described order. For example, some operations / steps can be decomposed, and some operations / steps can be combined or partially combined, so the actual execution order may be changed according to the actual situation.

[0047] The block diagrams shown in the figures are merely functional entities and do not necessarily necessarily correspond to physically separate entities. That is, these functional entities may be implemented in software, or in one or more hardware modules or integrated circuits, or in dif...

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Abstract

The invention discloses a line laser contourgraph point cloud calibration method and system based on a plane calibration block. The method comprises the steps that a line laser contourgraph is adjusted to be horizontal; the upper half part of the calibration block is a black and white regional square block for calibrating the X direction of the point cloud; the lower half part is a pure black area square block for calibrating the height direction of the point cloud; collecting height calibration data of the pure black area of the calibration block through a line laser contourgraph; calculating to obtain line pixel position information of the light bar through the height calibration data; analyzing the function relationship between the line pixel position information of the light bar and the horizontal distance information between the calibration block and the line laser contourgraph; x-direction calibration data of black and white alternated areas of the calibration block are collected through a line laser contourgraph; calculating the pixel equivalent of each row through X-direction calibration data; and analyzing the function relationship between the pixel equivalent of each row and the row pixel position information of the light bar. According to the invention, the detection precision can be improved on the premise that the hardware cost of the laser contourgraph is not increased.

Description

technical field [0001] The invention relates to the technical field of laser contour line calibration, in particular to a point cloud calibration method and system of a line laser profiler based on a plane calibration block. Background technique [0002] 3D line laser scanning profiler is often used for high-precision reconstruction of the contour surface of industrial products, so as to obtain the shape information and size information of the product, and realize fast, stable and non-destructive non-contact measurement. With the intelligent development of the industrial manufacturing field, the application scenarios of such detection methods are becoming more and more extensive, and the accuracy requirements are getting higher and higher. Furthermore, the calibration of the profiler needs to be more accurate and stable. [0003] The 3D line laser scanning profiler is mainly composed of lasers and photosensitive elements. The laser projects laser light to the surface of the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/73G06T7/90G06T7/521
CPCG06T7/73G06T7/90G06T7/521G06T2207/10028
Inventor 程庚麦浩晃刘立峰黄矿裕郭佳佳
Owner 昂视智能(深圳)有限公司