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Method and device for predicting scattered signal of X-ray and method for correcting scattered beam

A scattering signal and X-ray technology, applied in the field of X-ray scattering signal prediction, can solve problems such as unpredictability of scattering signals and difficult expansion of model dependence

Pending Publication Date: 2022-07-29
SIEMENS SHANGHAI MEDICAL EQUIP LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this algorithm has strong model dependence and is difficult to extend for wider applications
Current convolution kernel scatter correction algorithms are not able to predict an appropriate scatter signal for all cases when the scatter radiation contribution becomes larger and scan conditions become more complex

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  • Method and device for predicting scattered signal of X-ray and method for correcting scattered beam
  • Method and device for predicting scattered signal of X-ray and method for correcting scattered beam
  • Method and device for predicting scattered signal of X-ray and method for correcting scattered beam

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Embodiment Construction

[0043] It should be noted that the embodiments in the present application and the features of the embodiments may be combined with each other in the case of no conflict. The present application will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.

[0044] It should be noted that, unless otherwise specified, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

[0045] In this application, unless stated to the contrary, the use of directional words such as "upper, lower, top, bottom" is usually for the direction shown in the drawings, or for the component itself in vertical, In terms of vertical or gravitational direction; similarly, for the convenience of understanding and description, "inner and outer" refers to the inner and outer relative to the contour of each component itself, but the a...

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Abstract

The invention relates to a method and device for predicting scattered signals of X-rays and a method for correcting scattered beams. The method for predicting a scattered signal of an X-ray for an inspection object comprises the following steps: scanning each motif in a plurality of motifs in a scanning manner that the scattering degree of each motif is smaller than a reference scattering degree to obtain first projection data of each motif; scanning each motif in the plurality of motifs in a scanning mode that the scattering degree of each motif is equal to the reference scattering degree to obtain second projection data of each motif; obtaining a real scattering signal of each motif by subtracting the first projection data of each motif from the second projection data of each motif; training a learning model based on the second projection data of each motif and the real scattering signal of each motif to obtain a trained learning model; and applying the trained learning model to the projection data of the X-rays for the examination object to predict a scattered signal of the projection data of the X-rays.

Description

technical field [0001] The present application generally relates to the technical field of computed tomography CT projection signal correction and image processing, and more particularly, to a method for X-ray scattering signal prediction based on learning technology. Background technique [0002] Computed tomography CT has been widely used in the field of medical imaging, but since scattered radiation is an inherent X-ray characteristic, in the process of X-ray imaging of computed tomography CT, it will inevitably affect the image imaging. Mass of scattered radiation rays. Scattered radiation rays degrade image quality in CT imaging. [0003] Usually CT systems use an anti-scatter grid (ASG) on the detector hardware to reduce the effects from scattered signals, but with the use of wider and wider body detectors and the pressure on hardware costs, CT manufacturers are increasingly The more inclined to use software algorithms to calibrate the scattered signal. [0004] Var...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T11/00G06N3/04G06N3/08
CPCG06T11/005G06T11/008G06N3/04G06N3/08G06T2207/20084G06T2211/441
Inventor 汪洋张瑞康陈凯田毅
Owner SIEMENS SHANGHAI MEDICAL EQUIP LTD