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Measurement circuit, voltage regulation circuit and measurement method

A technology for measuring circuits and circuits, applied in the direction of measuring current/voltage, measuring electrical variables, measuring electricity, etc., can solve problems such as poor measurement accuracy, and achieve the effect of improving accuracy and reducing poor accuracy

Pending Publication Date: 2022-08-02
CHANGXIN MEMORY TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, the measurement accuracy of the above scheme is poor

Method used

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  • Measurement circuit, voltage regulation circuit and measurement method
  • Measurement circuit, voltage regulation circuit and measurement method
  • Measurement circuit, voltage regulation circuit and measurement method

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Embodiment Construction

[0040] Exemplary embodiments will be described in detail herein, examples of which are illustrated in the accompanying drawings. Where the following description refers to the drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with the embodiments of the present application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the embodiments of the present application, as recited in the appended claims.

[0041] The inventors found that there is a problem of poor measurement accuracy in the measurement of current assisted by electronic components. In order to solve this problem, the inventors have analyzed the scheme for the auxiliary measurement of electronic components and found that one of the reasons for the above problems is that the above-mentioned electr...

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Abstract

The invention provides a measuring circuit, a voltage adjusting circuit and a voltage adjusting method. The measuring circuit comprises a voltage stabilizing circuit, a circuit to be measured and measuring equipment, an electronic component is connected in series between the voltage output end of the voltage stabilizing circuit and the to-be-tested circuit, and the to-be-tested circuit is connected with the feedback end of the voltage stabilizing circuit; the voltage stabilizing circuit is used for adjusting the output voltage of the voltage output end according to the rated voltage of the to-be-tested circuit and the current voltage, received by the feedback end, of the to-be-tested circuit, so that the absolute value of the difference value between the rated voltage and the current voltage is smaller than or equal to a preset threshold value; and the measuring equipment is used for measuring to obtain the voltage at the two ends of the electronic component and / or the current passing through the electronic component. The current voltage of the to-be-tested circuit is ensured to be close to the rated voltage through the voltage stabilizing circuit, so that the current voltage received by the to-be-tested circuit is ensured to be sufficient, and the to-be-tested circuit is enabled to work normally. In this way, by selecting the electronic component with the large resistance value, the poor accuracy caused by the ground noise voltage of the measurement equipment can be reduced.

Description

technical field [0001] The embodiments of the present application relate to the technical field of semiconductors, and in particular, to a measurement circuit, a voltage adjustment circuit, and a measurement method. Background technique [0002] In the field of semiconductor technology, in order to better use the circuit, the current of the circuit during normal operation can be measured. The current can determine the power consumption, resistance and other performance parameters of the circuit to plan the use of the circuit. The circuit here can be any circuit that processes or stores data, such as a memory chip. [0003] In the prior art, the measurement of the current of the circuit under test can be assisted by an electronic component. refer to figure 1 As shown, an electronic component is connected in series between the power supply of the motherboard and the circuit to be tested, so that the current passing through the electronic component can be determined by measu...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R21/06G01R19/00G01R1/30
CPCG01R31/2832G01R19/0092G01R21/06G01R1/30
Inventor 郭恒飞
Owner CHANGXIN MEMORY TECH INC