Method and device of using compressed data in far-end fuse box to initialize integrated circuit

An integrated circuit, initialization technology, applied in the direction of logic circuits using specific components, logic circuits using basic logic circuit components, circuits, etc., can solve problems such as limiting the use of macros containing fuses, a large number of them, etc.

Inactive Publication Date: 2002-07-10
格芯公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The inability to place fuse-containing macros under other line and contact arrays or above other circuits severely limits the use of fuse-containing macros
It is possible to move all the fuses to a location where the fuses do not interfere with the contact array, but removing the fuses from the associated macro would require specialized design and either a large number of interconnects from the fuses to the associated macro, or A scheme of passing the value from the fuse to its associated macro is possible, but this requires a local latch and a remote latch for each fuse

Method used

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  • Method and device of using compressed data in far-end fuse box to initialize integrated circuit
  • Method and device of using compressed data in far-end fuse box to initialize integrated circuit
  • Method and device of using compressed data in far-end fuse box to initialize integrated circuit

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Embodiment Construction

[0022] Referring to the drawings and in particular to FIG. 1, there is depicted a block diagram of an integrated circuit according to a preferred embodiment of the present invention. Integrated circuit 10 includes a plurality of fuse programmable macros 16 . Fuse programmable macro 16 can implement various functional circuits inside integrated circuit 10 and need not be of the same or similar nature, but can be customized and / or repaired using fuse data retrieved from fuse block 11 . Repairable circuits include memory array macros in which fuse data is used to clear a memory element (eg, a row or column) and select a redundant element to replace its function. It will be appreciated that replacement of memory elements may be accomplished through multiplexers and demultiplexers, or various other techniques well known in the art. Customizable circuits include programmable logic array macros where fuse data is used to create combinational logic circuits that embed secure code on ...

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Abstract

A method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox allows a reduction in the number of fuses required to repair or customize an integrated circuit and allows fuses to be grouped outside of the macros repaired by the fuses. The remote location of fuses allows flexibility in the placement of macros having redundant repair capability, as well as a preferable grouping of fuses for both programming convenience and circuit layout facilitation. The fuses are arranged in rows and columns and represent control words and run-length compressed data to provide a greater quantity of repair points per fuse. The data can be loaded serially into shift registers and shifted to the macro locations to control the selection of redundant circuits to repair integrated circuits having defects or to customize logic.

Description

technical field [0001] The present invention relates to a fuse programmable integrated circuit, and more particularly relates to an integrated circuit with a fuse read start sequence. Background technique [0002] Fuse programmable integrated circuits are used in applications that require customization and / or repair of manufacturing defects. Functional testing must be performed on integrated circuits and printed circuit boards to ensure that defect-free products are screened out. In many cases, integrated circuits can be repaired after wafer fabrication by providing redundant circuit elements that can be selected by fuse programmable logic. For example, if a defect is detected in a row of cells, an entire column in the memory array can be replaced with a spare column that would otherwise render the memory unusable. Redundant cells enable improved yields through redundant circuits and fused electronic components at the expense of increased circuit area. [0003] The aforem...

Claims

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Application Information

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IPC IPC(8): H01L21/82G11C7/00G11C29/00G11C29/04H03K19/173
CPCG11C29/802G11C29/80G11C7/00
Inventor 达雷·L·阿那德小约翰·E·巴斯约翰·A·费费德帕梅拉·S·吉利斯彼得·O·杰考贝森道格拉斯·W·凯莫尔戴维·E·拉基史蒂文·F·奥克兰德迈克尔·R·奥莱蒂威廉·R·托蒂
Owner 格芯公司
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