Method for realizing stress optical waveguide polarization insensitivity of silicon group silicon dioxide with symmetric structure
A symmetrical structure, silicon dioxide technology, applied in the direction of optical waveguide and light guide, can solve the problem of polarization insensitivity of waveguide and related devices
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[0031] see figure 2 , diagram 2-1 A lower cladding layer 11 of silicon dioxide with a thickness of not less than 15 μm is formed on the silicon substrate 10 by thermal oxidation, flame hydrolysis (FHD) or plasma enhanced chemical vapor deposition (PECVD) to limit light leakage; Figure 2-2 The high refractive index SiON compensation layer 12 with adjustable waveguide birefringence is grown by PECVD method. The thickness and refractive index of the SiON compensation layer should be adjusted according to the birefringence of the actual silicon-based silicon dioxide stress optical waveguide. The refractive index can be adjusted by Control the content of N to achieve; Figure 2-3 Half of the SiON compensation layer 12 is symmetrically etched away by reactive ion etching (RCE) at the waveguide symmetry center; Figure 2-4 The core layer 13 with a thickness of 6 μm is grown by FHD method or PECVD method, and the refractive index is determined according to the refractive index di...
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