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Automatic test system with easily modified software

An automatic test system and software technology, applied in the direction of transmission system, digital transmission system, electronic circuit test, etc., can solve problems such as re-verification

Inactive Publication Date: 2006-08-30
TERADYNE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Semiconductor manufacturers may have to revalidate their entire test procedures if a new version of the software is released

Method used

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  • Automatic test system with easily modified software
  • Automatic test system with easily modified software
  • Automatic test system with easily modified software

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Embodiment Construction

[0022] Fig. 1 shows a general automatic test system in the prior art. To provide comprehensive and rapid testing, the automated testing system generally includes a testing machine body 112 , a computerized workstation 110 and a handling device 114 .

[0023] Computer workstation 110 controls conveyor 114 and testing machine body 112 . It controls the transport device 114 to position a semiconductor device (not shown) in contact with a plurality of test probes 118 on the tester body. Typically, a testing machine includes a separate test head containing test probes 118 . However, this distinction is not important for the present invention.

[0024] Then, the workstation 110 controls the testing machine body 112 to perform a series of tests on the device to be tested. Each test typically includes a startup portion in which control signals are sent from the workstation 110 to the testing machine body 112 . Control signals are typically numerical values ​​sent over bus 116 . T...

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Abstract

An automatic test system, such as might be used to test semiconductor devices as part of their manufacture. The test system uses instruments to generate and measure test signals. The automatic test system has a hardware and software architecture that allows instruments to be added to the test system after it is manufactures. The software is segregated into instrument specific and instrument independent software. Predefined interfaces to the software components allow for easy integration of instruments into the test system and also easy reuse of the software as the physical implementation of the test system or the instruments changes form tester to tester in a product family.

Description

[0001] related application [0002] This application claims priority to US Patent Application 60 / 466,127, filed April 28, 2003, entitled "Automatic Test System with Easily Modified Software." technical field [0003] The present invention relates generally to software architecture, and more particularly to software for automated test systems. Background technique [0004] Automated test systems (commonly referred to as "testers") are used in the manufacture of semiconductor devices. Usually, during the manufacture of a semiconductor device, it is tested at more than one stage, and the further processing of the device is determined based on the test results. In some cases, devices that fail the test are discarded. In some cases, the device can be repaired. For example, a device may be configured with redundant circuitry. If testing finds the faulty portion of the device, the faulty circuit can be disconnected and a redundant circuit element connected in its place. In oth...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/319G01R31/3183G06F9/44G06F19/00H04L1/22
CPCG01R31/31912G01R31/31917G01R31/31907
Inventor 斯蒂芬·J·霍特亚克阿兰·L·布利茨兰德尔·B·斯廷森
Owner TERADYNE