Integral semiconductor laser Michelson interferometer

Abstract

A Michelson interferometer of integral semiconductor laser is prepared as moving erection platform under spectroscope of existing Michelson interferometer towards left by 10 - 12 cm and fixing semiconductor laser firmly on top surface of platform at most left to make light source and Michelson interferometer be incoming angle of 45 degree and for setting extender lens freely between semiconductor laser and spectroscope.

Description

Technical field: [0001] The invention is used in the field of optical physics test and precision measurement. Background technique: [0002] There are following problems when using existing Michelson interferometer to carry out optical physics experiment and precise measurement: 1. used monochromatic (or quasi-monochromatic) light source (as sodium light, He-Ne laser, semiconductor laser etc.) In addition to the instrument, it is temporarily configured during use, which is inconvenient to operate; 2. Since the light source is not fixed, sometimes all the previous efforts in the adjustment will be wasted due to accidentally touching the light emitter by oneself or others; The two spots coincide to judge that mirror 1 and mirror 2 are perpendicular to each other, that is, the mirror images of mirror 1 and mirror 2 to the beam splitter are parallel to each other, this is only when mirror 1 and mirror 2 are mirror images of the beam splitter It is only established when the dist...

AI Technical Summary

Problems solved by technology

[0003] In order to overcome the problems that the existing Michelson interferometer has an external light source and is easy to be touched, the mirror distance between mirror 1 and mirror 2 is difficult to zero, the laser beam and the beam splitter surface are difficult to form a 45-degree incident angle, and the operation is repetitive and cumbersome. Invented and designed an integral semiconductor laser Michelson interferometer, which can completely solve these problems.

[0004] The invention solves the problems of Michelson interferometer with external light source, easy to be touched, difficult to adjust the mirror distance between reflector 1 and reflector 2, difficult to form a 45-degree incident angle between the laser beam and the spectroscopic mirror surface, and repetitive and cumbersome operations. Yes: Extend the installation platform under the beam splitter of the existing Michelson interferometer to the left by 10-12 cm, and the semiconductor laser is firmly installed on the far left, so that the light source and the Michelson interferometer are integrated, and the laser beam and the beam splitter surface are guaranteed With an incident angle of 45 degrees, the beam expander can be freely placed (or taken out) between the semiconductor laser and the beam splitter

Images