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Measuring circuit of LCOS display chip

A technology for displaying chips and test circuits, applied in static indicators, instruments, etc., can solve the problems of expensive test equipment, high test cost, long test time, etc., and achieve the effect of fast test speed, reduced test cost and low price

Inactive Publication Date: 2006-11-15
上海华园微电子技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, the conventional test method is carried out by general integrated circuit test equipment, but the test equipment is expensive, the test time is long, and the test cost is high

Method used

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  • Measuring circuit of LCOS display chip
  • Measuring circuit of LCOS display chip

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Embodiment Construction

[0013] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0014] Depend on figure 1 Visible: test circuit of the present invention comprises: tested LCOS display chip 4; Described tested LCOS display chip 4 comprises: control circuit 41, SRAM array 42, pixel electrode 43, analog switch 44, analog circuit 45; Also comprises : EEPROM program memory 1, microprocessor CPU2, test interface circuit 3, PC 5, RS232 serial interface 6, EEPROM data memory 7; described PC 5 outputs test order to microprocessor by RS232 serial interface 6 CPU2, microprocessor CPU2 control the test program of EEPROM program memory 1 and the test data of EEPROM data memory 7 and the clock signal CLK that needs to test, deliver to tested LCOS display chip 4 through test interface circuit (3), earlier will be tested LCOS display chip 4 is reset, SRAM array 42 and internal memory are cleared, and then LCOS display chip 4 executes the ...

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PUM

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Abstract

The present invention relates to a test circuit of LCOS display chip. It includes LCOS display chip to be tested, also includes the following several portions: PC machine, RS232 serial interface, microprocessor, EEPROM program memory, EEPROM data memory and test interface circuit. Said invention also provides its working principle and its concrete operation method.

Description

technical field [0001] The invention relates to the field of LCOS (Liquid Crystal On Silicon, that is, reflective liquid crystal projection technology based on large-scale integrated circuits), in particular to a test circuit for display chips in LCOS. Background technique [0002] LCOS digital TV dedicated chip is the core technology of the latest large-screen high-definition digital display technology in the world - LCOS (Liquid Crystal On Silicon, that is, reflective liquid crystal projection technology based on large-scale integrated circuits). [0003] LCOS is unanimously optimistic in the world, and it is most likely to enter the HDTV product technology of ordinary people's families with its high-quality technical indicators and low manufacturing cost, and has a very broad market prospect. The LCOS digital TV special chip adopts the international advanced 0.35μm and 0.25μm CMOS process technology. It is a high-performance and low-cost chipset. The chipset is used for t...

Claims

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Application Information

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IPC IPC(8): G02F1/133G09G3/00
Inventor 印义言张敏印义中
Owner 上海华园微电子技术有限公司