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Large-scale virtual base for test instruments, and forming method

A technology of virtual testing and instrument library, applied in the direction of program control devices, etc., can solve the problems of insufficient system testing methods, no introduction of principles and methods of deep integration, and no way of getting rid of hardware instrument stand-alone system manufacturing and calling forms.

Inactive Publication Date: 2007-05-09
秦树人
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Problems solved by technology

[0008] However, the disadvantage of the current virtual intelligent testing technology is that there is no new breakthrough in principle, so it is impossible for these resources to form a powerful technical resource that covers all disciplines and industries, and it is not enough to provide a full range of technical resources. system test method
One of the deep-seated reasons for the above situation is that the virtual intelligent test system has not established a unified model so far. Although functional software can mostly replace hardware components, it has not yet gotten rid of the manufacturing and calling form of hardware instrument stand-alone systems; although the functions of software have improved It improves the flexibility and openness of the instrument, but does not introduce the principles and methods of deep integration in manufacturing, so it is difficult to fundamentally change the current mode of virtual intelligent testing

Method used

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  • Large-scale virtual base for test instruments, and forming method
  • Large-scale virtual base for test instruments, and forming method
  • Large-scale virtual base for test instruments, and forming method

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Embodiment Construction

[0084] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0085] As shown in accompanying drawings 1, 2, 3, and 4: a large-scale virtual test instrument library, including an input device 1 and an output device 2, has an instrument resource library 3 and an instrument library development system 4, and the instrument resource library 3 is composed of non-intelligent controls library 5, function library 6, intelligent control library 7 and instrument library 8, and the instrument library development system 4 is respectively connected to non-intelligent control library 5, function library 6, and intelligent control library 7 in two directions for data transmission; non-intelligent control The library 5, the function library 6, and the intelligent control library 7 are independent of each other, and the instrument library development system 4 receives the data information of the input device 1 an...

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Abstract

A method for forming large scale of virtual test instrument library includes setting up instrument library structure; structuring non-intelligent control piece library, function library, intelligent control piece library and instrument library, laminating instrument library to generate development platform of intelligent control piece instrument and development platform of layer. The large scale of virtual test instrument library formed by said method is also disclosed.

Description

technical field [0001] The invention relates to the field of test instruments, in particular to a large-scale virtual test instrument library of a virtual test instrument and a forming method thereof. Background technique [0002] After searching, there are the following published patent documents related to virtual instruments: [0003] [1]Virtual instrumentation system and method for controlling a number ofinstruments, patent application number: WO200159406-A, WO200159406-A1, AU200138113-A [0004] [2]A virtual instrument bus using network programming, patent application number: G06F-003 / 02; G06F-003 / 14; G06F-003 / 147; G06F-015 / 403 [0005] In the past 10 years, due to the rapid and intensive penetration and expansion of information technology, mechanical testing technology and testing instruments have been deeply affected and severely challenged. New principles, new methods and new manufacturing processes in test systems are constantly emerging under the influence of inf...

Claims

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Application Information

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IPC IPC(8): G06F9/44
Inventor 秦树人
Owner 秦树人
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