Optical waveguide monitoring
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The invention features methods and apparatus for monitoring the quality in optical waveguides (e.g., photonic crystal fibers). The method is based on directing test light to the side of a waveguide (e.g., at a non-zero angle relative to the waveguide axis), and measuring the spectrum of light emerging (e.g., reflected) from the side of a waveguide in response to the test light. Measuring the spectrum includes measuring the intensity of light for a known wavelength or band of wavelengths (e.g., measuring an intensity for each wavelength or wavelength band in a range of wavelengths). Monitoring waveguide quality can include detecting structural defects (e.g., deviations in the core radius or cladding layer thickness, or the presence of air bubbles or contaminant particles) and compositional defects (e.g., variations in the refractive index of the core or cladding layers from their designed values) in the waveguide. The method can be implemented while the waveguide is being made (e.g....
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