Exposure apparatus and method for manufacturing device
a manufacturing device and exposure apparatus technology, applied in the direction of microlithography exposure apparatus, printers, instruments, etc., can solve the problems of insufficient focus margin during exposure operation, surface undulation, pattern image projected onto the substrate deterioration, etc., to prevent the deterioration of the pattern image projected onto the substrate, suppress the scattering of liquid, and improve the movement accuracy of the substrate stage
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[0022] Now, referring to the drawings, an exposure apparatus of the present invention will be described. FIG. 1 is an outline configuration drawing showing a first embodiment of an exposure apparatus of the present invention.
[0023] Referring to FIG. 1, an exposure apparatus EX is provided with a mask stage MST that holds a mask M, a substrate stage PST that holds a substrate P, an illumination optical system IL that illuminates the mask M held by the mask stage MST with exposure light EL, a projection optical system PL that projects a pattern image of the mask M illuminated with the exposure light EL onto the substrate P held by the substrate stage PST, and a controller CONT that controls the overall operation of the exposure apparatus EX. The projection optical system PL is configured to form an image plane thereabove. The mask stage MST that holds the mask M is disposed under the projection optical system PL, and on the other hand, the substrate stage PST that holds the substrate...
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