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Hierarchial semiconductor design

a semiconductor and hierarchy technology, applied in the field of semiconductor design, can solve problems such as complex, tedious and error-prone process, and limitations and disadvantages associated

Inactive Publication Date: 2006-11-09
MICRON TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The invention is a new approach to designing semiconductors and semiconductor test structures that is more flexible and easier to use than previous design approaches. The approach is based on a hierarchical design, where parameters are assigned to different components of a semiconductor to ensure that they perform correctly in different conditions. The invention avoids the need for designers to start from scratch when creating new objects, making the design process more efficient and less prone to errors. The approach also includes a software tool called Design Framework II, which helps designers create new objects with the desired parameters. The invention is useful for designing semiconductor devices and testing their performance.

Problems solved by technology

The pcell approach of DF2, however, is a top-down semiconductor design approach, and thus has limitations and disadvantages associated with it.
This can be a very complex, tedious and error-prone process.

Method used

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Examples

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Embodiment Construction

[0019] In the following detailed description of exemplary embodiments of the invention, reference is made to the accompanying drawings which form a part hereof, and in which is shown by way of illustration specific exemplary embodiments in which the invention may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention, and it is to be understood that other embodiments may be utilized and that logical, mechanical, electrical and other changes may be made without departing from the spirit or scope of the present invention. The following detailed description is, therefore, not to be taken in a limiting sense, and the scope of the present invention is defined only by the appended claims.

[0020] Those of ordinary skill within the art will appreciate that the detailed description is presented in accordance with the example of designing a semiconductor test structure. However, the invention itself is not limited to the...

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Abstract

Hierarchical semiconductor structure design is disclosed. One aspect of the invention is a computerized system that includes a semiconductor structure (such as a semiconductor test structure) and a basic atom. The system also includes a hierarchy of abstractions ordered from highest to lowest. Each abstraction relates a plurality of instances of an immediately lower abstraction; the highest abstraction corresponds to the structure, and the lowest abstraction corresponds to the basic atom. A plurality of sets of parameters also is included within the system, where each set of parameters corresponds to an instance of an abstraction. Changing one of the set of parameters for an instance changes at least one of the set of parameters for an instance of an immediately lower abstraction.

Description

RELATED APPLICATIONS [0001] This application is a Divisional of Ser. No. 10 / 230,937, filed Aug. 29, 2002, which is a Continuation of Ser. No. 09 / 031,398 filed on Feb. 26, 1998, now U.S. Pat. No. 6,449,757, which are incorporated herein by reference.FIELD OF THE INVENTION [0002] This invention relates generally to the design of semiconductors, and more particularly to such design that is hierarchical in nature. BACKGROUND OF THE INVENTION [0003] Semiconductor technology pervades most electronic devices today. Computers, televisions, videocassette recorders, cameras, etc., all use semiconductor integrated circuits to varying degrees. For example, the typical computer includes microprocessors and dedicated controller integrated circuits (i.e., video controllers, audio controllers, etc.), as well as memory, such as dynamic random-access memory. The design of semiconductors, therefore, is a crucial consideration of the design of almost any electronic device. [0004] One type of semiconduc...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): G06F17/50G06F40/189
CPCG06F17/5068G06F17/5045G06F30/39G06F30/30
Inventor KARNIEWICZ, JOSEPH J.
Owner MICRON TECH INC