Unlock instant, AI-driven research and patent intelligence for your innovation.

Packaging structure and method

a packaging structure and chip technology, applied in the direction of semiconductor devices, semiconductor/solid-state device details, electrical apparatus, etc., can solve the problems of poor electrical contact, reduce the reliability of the package, and reduce the reliability of the bonding interfa

Inactive Publication Date: 2006-11-16
CHIPPAC
View PDF32 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

"The invention is a method for connecting a flip chip to a substrate using a polymer adhesive. The method involves aligning the chip with the substrate, pressing them together, and heating the chip to form a metallurgical connection between the chip's bumps and the substrate's interconnect points. The resulting connection is made through an alloy formed at the interface between the bump material and the interconnect material. The method can be used with different types of bumps and interconnect points materials, such as gold or copper plated with gold or other metals. The resulting chip package structure includes a chip with bumps and a substrate with interconnect points, with an alloy formed at the interface between the bump material and the interconnect material."

Problems solved by technology

Fragments of the polymer film which remain trapped at the interconnection point often lead to poor electrical contact and reduced reliability of the package.
Additionally, the polymer film reduces the reliability of the bonding interface during the chip bonding process.
Conventional flip chip techniques that use either ACF, Non-Conductive Adhesive (NCA) or Non Conductive Polymer (NCP) also suffer from problems in curing the adhesive on adjacent bonding sites on a substrate during the chip bonding process.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Packaging structure and method
  • Packaging structure and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] A description of an exemplary embodiment of the invention follows. Using the disclosure herein, substantially conventional apparatus can be modified for use in the process of the invention.

[0014] With reference to the Figs., there are shown in FIG. 1A a chip and a substrate in alignment prior to forming the interconnect according to the invention, and in FIG. 1B a completed interconnect. The flip chip configuration, shown generally at 10, includes a plurality of bumps, e.g. 14, formed on the chip 12, the bumps preferably being gold (Au) stud bumps. The corresponding interconnection points, on a standard substrate 16 metallization are provided with a plurality of preferably pure tin (Sn) spots 18. A central area 20 of the chip on a bump side 22 further includes a spot of adhesive 24 small enough that it does not spread to the gold studs and the interconnection area during a subsequent bonding process. As the chip is connected to the substrate in the flip chip format, the adhe...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for forming metallurgical interconnections and polymer adhesion of a flip chip to a substrate includes providing a chip having a set of bumps formed on a bump side thereof and a substrate having a set of interconnect points on a metallization thereon, providing a measured quantity of a polymer adhesive in a middle region of the chip on the bump side, aligning the chip with the substrate so that the set of bumps aligns with the set of interconnect points, pressing the chip and the substrate toward one another so that a portion of the polymer adhesive contacts the substrate and the bumps contact the interconnect points, and heating the bumps to a temperature sufficiently high to form a metallurgical connection between the bumps and the interconnect points. Also, a flip chip package is made by the method. In some embodiments the metallurgical connection includes an alloy of gold and tin at the interface between the bumps and the interconnect points.

Description

CROSS REFERENCE TO RELATED APPLICATIONS [0001] This application claims priority from U.S. Provisional Application No. 60 / 188,568, titled “Packaging Structure and Method”, filed Mar. 10, 2000. This application is related to commonly assigned copending U.S. Application Atty. Docket No. 60084-300301 titled “Flip Chip Interconnection Structure” and U.S. Application Atty. Docket No. 60084-300101 titled “Flip Chip-in-Leadframe Package and Method”; both said related applications are being filed on the same date as this application, and are hereby incorporated by reference in their entireties herein.BACKGROUND OF THE INVENTION [0002] This invention relates to flip chip packaging and, more particularly, to providing a Au / Sn alloy interconnection between a chip and a substrate. [0003] Conventional methods for interconnecting a flip chip to a substrate include an Anisotropic Conductive Film (ACF) with Ni or Ni / Au coated polymer particles in which a contact type interconnection is made. Fragmen...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): H01L23/48H01L21/00H01L21/56H01L21/60H01L21/603
CPCH01L21/563H01L24/81H01L2924/07802H01L2224/2919H01L2224/29144H01L2224/29111H01L2924/0132H01L2924/014H01L2924/01076H01L2924/01033H01L2924/01006H01L24/29H01L2924/01082H01L2924/01079H01L2924/01058H01L2924/0105H01L2924/01029H01L2224/92125H01L2224/83194H01L2224/83191H01L2224/1134H01L2224/13144H01L2224/13147H01L2224/16145H01L2224/16225H01L2224/73203H01L2224/81203H01L2224/81801H01L2224/83102H01L2924/01028H01L2924/00H01L2924/00012H01L2924/00014H01L2924/181H01L2224/10135H01L2224/81139H01L21/60
Inventor AHMAD, NAZIRKWEON, YOUNG-DOTAM, SAMUELKIM, KYUNG-MOONPENDSE, RAJENDRA D.
Owner CHIPPAC