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Field imager

a field imager and field technology, applied in the direction of measuring devices, instruments, converting sensor output, etc., can solve problems such as non-uniform field

Inactive Publication Date: 2007-10-18
BADAWY CONSULTANT
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

"The invention provides a sensor device and a detection apparatus that can sense changes in an electromagnetic field caused by the presence of a sample, such as organic matter or cells, using a FET sensing unit. The sensor device includes a source, drain, and gate, with the gate being sensitive to changes in the electric, magnetic, or electromagnetic field. The detection apparatus includes a chamber, a port for introducing a sample, an actuation unit for creating an electromagnetic field, and a sensing unit for detecting changes in the field. The changes in the field can be used to determine the impedance of the sample or create a 2D image of the field. The actuation unit can be controlled by feedback from the sensing unit. The invention allows for the simultaneous generation and sensing of changes in the electromagnetic field, making it easier to detect samples."

Problems solved by technology

The field may be non-uniform.

Method used

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Embodiment Construction

[0040] The electric field imager disclosed herein is based on conventional TSMC 0.18 μm CMOS technology. Some simulation and experimental results are presented at the end of the disclosure. Referring now to FIG. 1a, the proposed microsystem 10 comprises (a) an actuation unit 12, which is in a quadruple electrode configuration as shown in FIG. 1b to produce the required DEP force to levitate the sample, for example, a cell, that we want to characterize; (b) a sensing unit 14, which is a Differential Electric Field Sensitive Field Effect Transistor (DeFET), where, to obtain an image of the electric field, and characterize the levitated cell, the DeFET is used in an array form, and the read out circuit [i.e. the electric field-to-voltage converter (E-to-V converter) circuit] is on a chip; (c) a characterization unit 16 to analyze the images and determine characteristics of the sample; (d) a chamber 18 to hold the sample with ports for inserting the sample; and (e) a controller 20 for c...

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Abstract

A detection apparatus for detecting the presence of a sample, the detection apparatus comprising a chamber, ports for introducing a sample within the chamber, an actuation unit for establishing a controllable electromagnetic field in the chamber; and a sensing unit for sensing changes in the electromagnetic field due to the presence of the sample within the chamber. The sensing unit comprises a sensor device comprising a source and a drain embedded in a FET a gate for the FET, in which the gate is formed of a material whose conductivity is related to the electromagnetic field established in a nonconductive medium in contact with the gate.

Description

BACKGROUND OF THE INVENTION [0001] The behavior of matter in electrical or magnetic field, especially nonuniform fields, is of interest to scientists of various branches: Physics, chemistry, engineering, or life sciences. To chemists and physicists, it's a science of many and varied phenomena. To engineers, it's a source of new and useful techniques for separating, levitating, and rotating materials or improving material behavior. [0002] In recent decades, Dielectrophoresis has become a fairly well known phenomenon in which a spatially nonuniform electric field exerts a net force on the field-induced dipole of a particle. Particles with higher polarizability than the surrounding medium experience positive dielectrophoresis and they move toward regions of highest electric field concentration. Particles less polarizable than the surrounding medium experience negative dielectrophoresis, and move towards regions of low electric field concentration. The force depends on the induced dipol...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L29/82G01R33/00
CPCH01L27/14679G01D5/145
Inventor GHALLAB, YEHYABADAWY, WAEL
Owner BADAWY CONSULTANT