Clock data recovery circuit and semiconductor device
a data recovery circuit and semiconductor technology, applied in the direction of synchronization signal speed/phase control, digital transmission, pulse automatic control, etc., can solve the problems of deteriorating data transfer efficiency, difficult to maintain synchronization, and difficult for the clock to follow the pattern change of data, so as to minimize the jitter of the clock and improve the follow ability
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first embodiment
[0043]A first embodiment of the present invention will be explained. FIG. 1 is a block diagram showing a configuration of a clock data recovery circuit 10 according to the first embodiment of the present invention.
[0044]In the first embodiment, the clock data recovery circuit 10 is formed in a semiconductor IC (Integrated Circuit) mounted on a reception device (not shown). As shown in FIG. 1, the clock data recovery circuit 10 includes a reception circuit 11; a data latch circuit 12; and a PLL (Phase Locked Loop) circuit 13.
[0045]In the first embodiment, the reception circuit 11 is configured to generate a received data signal DIN through receiving and amplifying a series of data pieces synchronized with a reference clock signal.
[0046]FIG. 2 is a time chart showing a relationship between the received data signal DIN and regenerated clock signals CK1 to CK10 of the clock data recovery circuit 10 according to the first embodiment of the present invention. As shown in FIG. 2, the recei...
second embodiment
[0099]A second embodiment of the present invention will be explained next. In the second embodiment, the phase comparison circuit 14 of the clock data recovery circuit 10 has a configuration different from that of the phase comparison circuit 14 of the clock data recovery circuit 10 in the first embodiment.
[0100]FIG. 15 is a circuit diagram showing a circuitry configuration of the phase comparison circuit 14 of the clock data recovery circuit 10 according to the second embodiment of the present invention.
[0101]As shown in FIG. 15, the phase comparison circuit 14 includes up signal generating circuits 33a to 33e and down signal generating circuits 34a to 34e. The up signal generating circuits 33a to 33e include the EXOR circuits 41a to 41e, the AND circuits 51a to 51e, and OR circuits 81a to 81e. The down signal generating circuits 32a to 32e include the EXOR circuits 42a to 42e, the AND circuits 52a to 52e, and OR circuits 82a to 82e.
[0102]In the second embodiment, the EXOR circuit...
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