Workpiece grinding method
a workpiece and grinding method technology, applied in the field of workpiece grinding methods, can solve the problems of workpiece cracking and scratching on the ground surface of workpieces, and achieve the effect of restrainting the grinding ston
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[0017]A workpiece W depicted in FIG. 1 is, for example, a semiconductor wafer which is circular plate-like in external form, the base material of which is silicon, and which is provided on a front side Wa thereof with a device region Wa1 and a peripheral surplus region Wa2 surrounding the device region Wa1. The peripheral surplus region Wa2 is that region of the front side Wa of the workpiece W which is on the outside of an imaginary line L1 represented by an alternate long and two short dashes line in FIG. 1. The device region Wa1 is partitioned in a grid pattern by a plurality of division lines (streets) S intersecting orthogonally, and a device D such as an IC is formed individually in each of regions partitioned in the grid pattern. A back side Wb of the workpiece W is a to-be-ground surface to be subjected to grinding. Note that the workpiece W may be formed from gallium arsenide, sapphire, gallium nitride, silicon carbide or the like, other than silicon.
[0018]Each of steps in ...
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