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Beam-adjusting optics

a beam-adjusting and optics technology, applied in the field of optics, can solve the problems of difficult implementation of independent adjustment of the focal spot of each laser, poor optical performance, and high cost of differential micrometers, and achieve the effect of precise positioning of the focus spo

Active Publication Date: 2010-08-31
BECTON DICKINSON & CO
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This solution allows for precise and cost-effective adjustment of the focal spot in flow cytometers and other applications, enhancing the precision and reducing the need for expensive mechanical systems, while maintaining high sensitivity and control over the focus spot.

Problems solved by technology

Optimal performance is compromised if the focused light beam is not properly adjusted on the core stream, and flow cytometers typically include one or more devices for adjusting the positioning of the focused light beam on the core stream.
Conventional positioning methods typically employ expensive differential micrometers to position the light source itself or optical elements, such as mirrors or prisms.
One disadvantage of this typical implementation is that independent adjustment of the focal spot of each laser is not easily implemented.

Method used

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Embodiment Construction

[0023]The following definitions are provided for clarity. Unless otherwise indicated, all terms are used as is common in the art. All reference cited herein, both supra and infra, are incorporated herein by reference.

[0024]As used herein, the “equivalent focal length” or “combined focal length” of a compound optical system refers to the focal length of a compound optical system, given as if it were a single optical element. The equivalent focal length is the distance from the secondary principle point of the compound optical system to the focal point. The equivalent focal length, feq, for a combination of two components is related to the focal lengths of the two components by the following equation:

[0025]feq=f1·f2f1+f2-d,(1)

wherein f1 and f2 are the focal lengths of the individual components and the d is the distance between the components. The equivalent focal length of a optical system containing more that two components can be calculated by first calculating the equivalent focal ...

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PUM

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Abstract

The present invention provides an optical analyzer having illumination optics that include a light source, such as a laser or other source, adapted to emit a collimated, or approximately collimated, light beam, a focusing lens that focuses the beam onto a focus spot within a detection region, and beam-adjusting optics positioned in the light path between the light beam source and the focusing lens, which allow for precise positioning of the focus spot within the detection region. The beam-adjusting optics of the present invention comprise at least one movable focusing lens, mounted in a positioning device that allows repositioning of the lens in a plane perpendicular to the light path.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]The present application claims priority to U.S. provisional application Ser. No. 60 / 993,758, filed Sep. 14, 2007, which is incorporated herein by reference in its entirety.BACKGROUND OF THE INVENTION[0002]1. Field of the Invention[0003]The present invention relates to the field of optics and, in particular, to laser optics, as used in optical analyzers.[0004]2. Description of Related Art[0005]Particle analyzers, such as flow and scanning cytometers, are well known analytical tools that enable the characterization of particles on the basis of optical parameters such as light scatter and fluorescence. In a flow cytometer, for example, particles, such as molecules, analyte-bound beads, or individual cells, in a fluid suspension are passed by a detection region in which the particles are exposed to an excitation light, typically from one or more lasers, and the light scattering and fluorescence properties of the particles are measured. Partic...

Claims

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Application Information

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Patent Type & Authority Patents(United States)
IPC IPC(8): G02B9/04G01N21/00G02B27/64G02B9/12
CPCG01N15/1434G01N15/1459G02B7/08G01N2015/1452
Inventor CHEN, YONG QIN
Owner BECTON DICKINSON & CO
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