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Method and device for analyzing damage

A fault analysis method and technology of fault analysis, applied in the direction of program control device, error detection/correction, electronic circuit test, etc., can solve unrealistic problems and achieve high efficiency

Inactive Publication Date: 2007-12-12
PANASONIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

But it is unrealistic from a development cost point of view to develop and implement countermeasures for each of these failures in the software development process so that the same failure does not occur a second time

Method used

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  • Method and device for analyzing damage
  • Method and device for analyzing damage
  • Method and device for analyzing damage

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Embodiment Construction

[0024] Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The following descriptions of each ideal embodiment are merely examples in nature and are not intended to limit the invention, its suitability, or its uses in any way.

[0025] (1) Software development process

[0026] FIG. 1 shows an embodiment of the present invention, that is, a software development flow using a fault analysis device. In general, the software development process is described using a so-called waterfall model that develops in one direction. The waterfall model includes a planning step 11, a design step 12, an installation step 13, and a verification step 14. As an added note, one variation of the waterfall model can be considered the spiral model. This spiral model is developed while increasing the degree of completion by repeatedly executing the design step 12, the installation step 13, and the verification step 14.

[0027] Inappropriate...

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Abstract

In a cause categorization step, bugs are categorized according to technical causes. In a damage evaluation step, how many steps the process has turned back due to a bug is measured. In a damage calculation step, damages are calculated for each bug technical cause. In a problem extraction step, a technical cause of which the damage is large is chosen as a problem. Then, in the bug database search step, a search for a measure for the bug technical cause extracted as a problem is performed with reference with a bug database so as to indicate an appropriate measure for a project.

Description

technical field [0001] The invention relates to fault analysis in software development flow. In particular, it relates to a failure analysis method and device for helping to establish countermeasures in the software development process starting from the technical cause of the failure and its damage to the progress state of the project. Background technique [0002] In the existing software development project, from the point of view of quality management, there is a quality problem tracking method and support system that can prevent a bad phenomenon that has occurred once from happening again (refer to, for example, Japanese Laid-Open Patent Publication 2003 - Bulletin No. 187069). [0003] However, the above-mentioned prior art has the following problems. That is to say, in software development engineering, a large number of hundreds of faults are also often found in the system testing step which is a downstream stage of development. As this software development process,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/36G06Q99/00G01R31/28G06F9/44G06F11/00
CPCG06F11/3604
Inventor 玉越靖司
Owner PANASONIC CORP