Cage-shaped multipolymer porous superlow dielectric silicon oxide film and method for preparing same
An ultra-low dielectric and polymer technology, which is applied in the field of ultra-low dielectric silicon oxide films made of cage-type polymers and its preparation, can solve the problems of difficulty in controlling the pore size of the film, the decrease of the mechanical properties of the film, and the adhesion of silicon wafers. Poor performance and other problems, to achieve the effect of size reduction, stable electrical properties, and good adhesion
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Embodiment 1
[0025] Embodiment 1: the prepared low dielectric constant insulating dielectric silicon oxide film of the present invention is made of cage octapolyhydrogensilsesquioxane (Si 8 o 12 h 8 ) with allylsilsesquioxane and phenyltriethoxysilane:
[0026] The chemical bonds in the film are Si-O bonds, Si-C bonds and C-H bonds; the film contains nano-micropores with a diameter of 5 nanometers, and the volume ratio of the micropores to the film is 20%; the thickness of the film is 350 nanometers.
[0027] The preparation method of above-mentioned film is:
[0028] 1. Hydrosilylation of cage octahydrogen silsesquioxane and allyl silsesquioxane under the catalysis of chloroplatinic acid to obtain octapropyl silsesquioxane terminal cage octasilsesquioxane oxane, as a porogenic template.
[0029] 2. Using the above-mentioned porogenic template and phenyltriethoxysilane as raw materials, wherein dimethyl dimethide is hydrolyzed in tetrahydrofuran under the catalysis of dilute acid to ob...
Embodiment 2
[0030] Embodiment 2: the prepared low dielectric constant insulating dielectric silicon oxide film of the present invention is made of tetramethylammonium octahydroxide cage octapolysilsesquioxane (Si 8 o 8 (ON(CH 3 ) 4 ) 8 ) and methyltrimethoxysilane as materials, the chemical bonds in the film are Si-O bonds, Si-C bonds and C-H bonds; the film contains nano-micropores with a pore diameter of 2 nanometers, and the volume ratio of the micropores to the film is 30%; the thickness of the film is 200 nm.
[0031] The preparation method of the film is as follows: octahydroxide tetramethylammonium cage octapolysilsesquioxane and methyltrimethoxysilane are used as raw materials. Wherein the ratio of tetramethylammonium octahydroxide cage octapolysilsesquioxane and methyltrimethoxysilane is 1: 1, sol is made under weak base catalysis in ethanol, makes 0.5% concentration sol, in The film was spin-coated at 4000 rpm, annealed at 400°C under argon gas, and the heating rate was 10°...
Embodiment 3
[0032] Embodiment 3: The low dielectric constant insulating dielectric silicon oxide film prepared by the present invention is made of octachloropropyl cage octapolysilsesquioxane, dimethyldimethoxysilane and ethyl orthosilicate , the chemical bonds in the film are Si-O bonds, Si-C bonds and C-H bonds; the film contains nano-micropores with a pore diameter of 4 nanometers, and the volume ratio of the micropores to the film is 50%; the thickness of the film is 400 nanometers.
[0033] The preparation method of above-mentioned film is:
[0034] 1. The ratio of octachloropropyl cage-type octasilsesquioxane to dimethyldimethoxysilane is 1:8, and the eight chloropropyl groups are silanized to form a pore-making template through a Grignard reaction.
[0035] 2. The ratio of the above-mentioned porogenic template and ethyl orthosilicate raw material to methyl orthosilicate is 1:4, and hydrolyzed under acid catalysis in dimethylformamide to obtain a sol with a concentration of 0.3%, a...
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