Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Display card testing method for embedded system

An embedded system and test method technology, applied in the direction of error detection/correction, instrumentation, electrical digital data processing, etc., can solve the problems of long test environment time and high space requirements

Inactive Publication Date: 2008-12-31
XUZHOU LIFANG MECHANICAL & ELECTRICAL EQUIP MFG CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, especially for the production line test of calculators in practical applications, there are problems that the time to create a test environment is too long and the space requirement is too high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Display card testing method for embedded system
  • Display card testing method for embedded system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] figure 1 It is a flow chart of the Mode test of the VideoCard test according to the method of the present invention. Its steps of this test method include: test initialization (step 10), wherein test initialization (step 10) comprises: obtain current test console file descriptor Getfd (step 101), judge whether need to switch this test console (step 102) , if needed, then switch ChangeVT, utilize ioperm to set the port I / O authority and utilize iopl to change the I / O authority level (step 103), LRMI (Linux Real ModeInterface, a real mode interface under a protected mode) initialization (step 104) in order to support VESAINT 10 calls. And utilize I / O total control function ioctl (0, KDSETMODE, KD_GRAPHICS) to set current mode as graphics mode (step 105); Save current VESA graphics buffer (FrameBuffer) state (step 11), utilize VESA 4F04 function call to obtain current graphics Buffer (FrameBuffer) state, this step includes using VESA 4F04 function call 1 to obtain the re...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention relates to a kind of testing method of the display card of embedded system, and its step comprises: test initialization, wherein test initialization comprises: obtain current test console file descriptor, judge whether need to switch this test console, set port I / O permission and change the I / O permission level, LRMI initialization and setting the current mode to graphics mode. Save the current VESA graphics buffer (FrameBuffer) state; set the test display mode; draw the test card test pattern; and restore the current VESA graphics buffer (FrameBuffer) state. It takes less time to create a test environment and requires less space, and the test of the display card under Linux can be completed without loading Xlib.

Description

technical field [0001] The invention relates to a display card testing method, in particular to a display card testing method under the Qt / Embeded system. Background technique [0002] Qt / Embedded is a Qt version for embedded systems developed by the famous Qt library developer Trolltech, which adopts the Server / Client structure. Qt / Embedded continues the graphical user interface of Qt in X Window (X Window is referred to as X, which is a "Client-Server" structure. Client refers to the application program executed under X Window and needs X Server to serve it; Server refers to It is the X Window system that manages your desktop, called X Server. In addition to being responsible for GUI interface management and providing Client-side services, X Server also manages the occurrence and delivery of system resources and events. Client and Server are connected through X Protocol Interaction. X Protocol defines the structure and specification of data transmission and reception betw...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/267
Inventor 王鹏陈玄同刘文涵
Owner XUZHOU LIFANG MECHANICAL & ELECTRICAL EQUIP MFG CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com