Treating meter and signal measurement for semiconductive high-molecular material pressure and temp sensor

Abstract

The present invention relates to a semiconductive high-molecular material pressure and temperature sensor processing instrument and its signal test method. Said invented product includes memory, program ALU, A / D converter, program controller, sampling resistors, current-limiting resistors, temperature sensor, pressure sensor and power supply. Said invention also provides the concrete connection mode of them, and said invented product can be used for making downhole pressure and temperature detection of oil field submersible pump.

Description

Technical field: [0001] The invention relates to a processing instrument and signal test of a semiconductive polymer material pressure and temperature sensor. Background technique: [0002] At present, various sensors at home and abroad, including more than 25,000 kinds of sensors in the patent library, many of which are devoted to the improvement of the structure of the sensor, but the sensing material used in the traditional sensor has low sensitivity, and the obtained signal must pass the signal Enlarging can only be used, resulting in complex structure of the sensor, especially under the action of high temperature and high pressure, the test data offset phenomenon is serious, it is impossible to carry out precise testing in harsh environments or high temperature and high pressure, resulting in inaccurate monitoring data, other technical improvements Difficult to advance, therefore, the improvement of the sensor has become the focus of research in developed countries such...

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Problems solved by technology

[0002] At present, various sensors at home and abroad, including more than 25,000 kinds of sensors in the patent library, many of which are devoted to the improvement of the structure of the sensor, but the sensing material used in the traditional sensor has low sensitivity, and the obtained signal must pass through the signal Enlarging can only be used, resulting in a complex sensor structure, especially under the action of high temperature and high pressure, the test data offset phenomenon is serious, it is impossible to carry out precise testing in harsh environments or high temperature and high pressure, resulting in inaccurate monitoring data, other technical improvements Difficult to advance, therefore, the improvement of sensors has become a focus of research in developed countries such as the United States

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