Nanometer precision real-time interferometric measurement device of object surface shape and measurement method therefor
A technology of interferometric measurement and object surface, which is used in measurement devices, optical devices, instruments, etc., to achieve the effect of short measurement time and improved measurement time
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[0040] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.
[0041] see first figure 1 , figure 1 It is a structural schematic diagram of the nano-precision measuring device for the surface topography of the object of the present invention. It can be seen from the figure that the real-time interferometric measurement device with nanometer accuracy of the surface topography of the object of the present invention includes a light source 1, and along the forward direction of the output beam of the light source 1 are a collimating beam expander 2, a beam splitter 3 and an object to be measured 5 in sequence. , there is a reference mirror 4 in the direction of the reflected beam of the beam splitter 3, and a photodetection element 6 is provided in the direction of the transmitted beam in which the reflected beam of the reference mirror 4...
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