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Oxide ridged waveguide structure between multilayer metals and method for making same

A ridge waveguide and multi-layer metal technology, which is applied in the field of silicon-based monolithic optoelectronic integration, can solve the problems of silicon-based monolithic integration of light sources, waveguides and detectors, etc.

Inactive Publication Date: 2009-04-15
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The ridge waveguide structure using SOI as the substrate cannot be realized by standard CMOS process, so it is impossible to integrate light source, waveguide and detector on a silicon-based monolithic chip on the standard CMOS process line

Method used

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  • Oxide ridged waveguide structure between multilayer metals and method for making same
  • Oxide ridged waveguide structure between multilayer metals and method for making same
  • Oxide ridged waveguide structure between multilayer metals and method for making same

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Embodiment Construction

[0020] see image 3 As shown, a multilayer intermetallic oxide ridge waveguide structure of the present invention includes:

[0021] The multilayer metal 314 and the oxide layer 315 between the multilayer metal 314; the multilayer metal 314 is used as the cover layer, and the oxide layer 315 between the multilayer metal 314 is used as the core layer of the ridge waveguide; since both the light-emitting diode and the detector diode can pass through The active region 317 and the well 316 on the silicon substrate 301 are formed, so the ridge waveguide structure can be integrated with the light source and the detector; it is characterized in that its structure includes:

[0022] A silicon substrate 301;

[0023] An oxide isolation layer 313, which is located on the substrate 301 and the well 316, for isolating different electronic devices;

[0024] A PSG phosphosilicate glass 302, the PSG phosphosilicate glass 302 is fabricated on the oxide isolation layer 313, the active region...

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Abstract

A multi-layer metal oxides ridge waveguide structure, it contains: a silicon lining bottom; a oxide isolation layer on the lining and trap to isolate different electronic devices; A PSG phosphorus silicon oxide glass made on the isolation layer, the active region and trap; the first layer of metal produced in PSG phosphorus silicon glass, as the waveguide cladding; the first layer oxide layer produced in the first layer of metal; the second layer produced in the first layer of metal oxide layer; the second layer oxide production in the second layer of metal; the third layer of metal production in the second oxide layer; the third layer oxide production in the third layer of metal; the fourth layer of metal produced at the top level in the third oxide layer; The first layer of metal contact with the second layer of metal, the second layer of metal contact with the third layer of metal, the third and fourth layers of metal contacted as a restricted ridge waveguide horizontal layer, so that light is restricted within the ridge waveguide.

Description

technical field [0001] The invention relates to a silicon-based monolithic optoelectronic integration technology, in particular to a multilayer intermetallic oxide ridge waveguide structure and a manufacturing method thereof, which can be realized by completely standard CMOS technology. Background technique [0002] The integration level of integrated circuits is rapidly advancing at a rate of doubling every two years according to Moore's Law, and the simultaneous reduction in the size of transistors and interconnection lines makes the integration level of chips higher and higher. As the level of integration increases, the delay of individual transistors becomes smaller and smaller, while the delay of interconnect lines becomes larger and larger. This is because the reduction in the size of the interconnection wires increases the resistance of the interconnection wires. Although the use of copper interconnections instead of the previous aluminum interconnections can reduce t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02B6/12G02B6/13
Inventor 陈弘达黄北举顾明刘海军
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI