Nitride semiconductor device and method for manufacturing same
A technology of nitride semiconductors and manufacturing methods, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems that current density field effect transistors are difficult to achieve at the same time, achieve high current density, suppress thickness deviation, Effect of small gate leakage current
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no. 1 example
[0047] FIG. 1 is a cross-sectional view showing a nitride semiconductor device according to a first embodiment of the present invention. The nitride semiconductor device of this embodiment is a field effect transistor used as a high-power transistor.
[0048] As shown in FIG. 1 , the nitride semiconductor device of the present embodiment includes: a sapphire substrate 101 with (0001) plane as the main surface; A nanometer aluminum nitride buffer layer 102; a non-doped gallium nitride layer 103 with a thickness of 2 microns on the aluminum nitride buffer layer 102; a thickness of 25 μm on the non-doped gallium nitride layer 103 A nanometer non-doped aluminum gallium nitride layer 104; a p-type aluminum gallium nitride layer 106 with a thickness of 100 nanometers set on a part of the non-doped aluminum gallium nitride layer 104; A high-concentration p-type gallium nitride layer 107 with a thickness of 5 nanometers is disposed on the layer 106 . Here, the so-called "non-doped" ...
no. 2 example
[0073] FIG. 6 is a cross-sectional view showing a nitride semiconductor device according to a second embodiment of the present invention.
[0074] As shown in this figure, the nitride semiconductor device of this embodiment includes: a sapphire substrate 601 with (0001) plane as the main surface; A nanometer aluminum nitride buffer layer 602, a non-doped gallium nitride layer 603 with a thickness of 2 micrometers, an undoped aluminum gallium nitride layer 604 with a thickness of 25 nanometers, a magnesium-doped aluminum alloy layer with a thickness of 5 nanometers The first p-type AlGaN layer 605 , the second p-type AlGaN layer 607 with a thickness of 100 nm and doped with Mg, and the high-concentration p-GaN layer 608 with a thickness of 5 nm. Here, in the nitride semiconductor device of this embodiment, the undoped aluminum gallium nitride layer 604, the first p-type aluminum gallium nitride layer 605, and the second p-type aluminum gallium nitride layer 607 are made of, for...
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