Rotating-disk testing classifier

A sorting device and a rotary table type technology, which is applied in the field of rotary table test sorting devices, and can solve the problems of time-consuming, inconvenient replacement operation, and prolonged time.

A sorting device and a rotary table type technology, which is applied in the field of rotary table test sorting devices, and can solve the problems of time-consuming, inconvenient replacement operation, and prolonged time.

CN101073799AInactive Publication Date: 2007-11-21CHROMA ATE
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  • Rotating-disk testing classifier
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  • Rotating-disk testing classifier

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Embodiment Construction

[0021] The carousel type testing and sorting device of the present invention will be described in detail below through preferred embodiments and accompanying drawings. Before the present invention is described in detail, it is noted that in the following description, similar elements are denoted by the same numerals.

[0022] As shown in FIG. 2 , the first preferred embodiment of the turntable testing and sorting device of the present invention is electrically connected to a tester (Tester) 2 and is suitable for testing several semiconductor package components 3 . The test equipment 2 is mainly capable of performing electrical tests and characteristic analysis on the semiconductor package components 3. The turntable type test and sorting device includes a material placement unit 4, a turret unit 5, a material removal unit 6, a A test interface unit 7 and a controller 8 .

[0023] The material placement unit 4 has five stacked magazines 41 stacked up and down, and the magazine...

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Abstract

The invention is concerned with turntable testing classify equipment that is used to test and classify semiconductor element, consists of: the material placing unit, the rotating unit, the sampling unit, and the testing interface unit. The rotating unit is with a center axis and at least one template that sets on the center axis, the testing interface unit is set on each template and provided the table connection for the semiconductor element. The disc shape of template can decrease the occupied plane space, the rotating of the template can reduce the moving distance of the sampling unit in order to short the taking time of the semiconductor element and the testing time, reduce the cost.

Description

technical field [0001] The invention relates to a test sorting device, in particular to a turntable test sorting device. Background technique [0002] A complete integrated circuit (IC) manufacturing can roughly include the initial IC design (IC Design) and wafer manufacturing (Wafer Fabrication), the mid-term wafer testing (WaferSorting) and packaging (Assembly & Packaging), and the later stage Final test (Final Test) and product shipment (Shipment). [0003] While integrated circuits are increasingly miniaturized, the manufacturing process of the above-mentioned integrated circuits is very important in every process stage. The final final test in the later stage is to test the electrical function of the packaged product after the integrated circuit is packaged, so as to ensure the functional integrity of the integrated circuit at the factory, and to classify the tested product according to its electrical function (that is, Bin), as the evaluation basis for different grad...

Claims

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Application Information

Patent Timeline
21 Nov 2007
Publication
CN101073799A
IPC
B07C5/344
Inventors
许良宇