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Falling testing system and test method

A test system and test method technology, which is applied in the direction of optical instrument test, machine/structural component test, measuring device, etc., can solve the problems of height error, test speed and test efficiency, etc.

Inactive Publication Date: 2008-03-26
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In manual testing, each free fall will have a height error, and if the number of tests is large, the test speed and test efficiency will be greatly affected

Method used

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  • Falling testing system and test method
  • Falling testing system and test method
  • Falling testing system and test method

Examples

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Embodiment Construction

[0023] In order to further illustrate the present invention, a preferred embodiment is given and described in detail below with accompanying drawings.

[0024] Referring to Fig. 1, the drop test system 10 of the embodiment of the present invention includes a positioning controller 11, an image taking and positioning device 12 for measuring the position of the test piece 20 and taking an image of the test piece 20, A pick-and-place device 13 for picking and placing the piece to be tested 20 and a control device 14 that controls the pick-and-place device 13 according to the measurement and image-taking results of the image-taking and positioning device 12, and the control device 14 is connected with the image-taking and positioning device respectively. The device 12, the positioning controller 11 and the pick-and-place device 13 are electrically connected.

[0025] The positioning controller 11 may be a three-axis controller, including a base 111 and a positioning control arm 11...

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PUM

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Abstract

A kind of decline test system includes a location controller, an imaging location device to image for the tested piece and measure the tested piece position, a pick-putting device and a controller to control the pick-putting device according to the image result. The controller is connected with the imaging location device, pick-putting device and the location controller electrically. The location controller controlled by the controlling device controls the pick-putting device work. The pick-putting device tests the piece decline in the control of the controlling device and location controller. The decline system can pick and put the tested piece automatically to improve the test speed and efficiency.

Description

technical field [0001] The present invention relates to a drop test system, in particular to a drop test system and a test method suitable for camera lens modules. Background technique [0002] With the continuous development of science and technology, portable electronic devices such as mobile phones are widely used and tend to be light, beautiful and multi-functional. The camera function is an additional function of the popular mobile phones in recent years. The digital camera module used in mobile phones must not only meet the requirements of thinness and shortness, but also have high performance and quality. Therefore, after the digital camera lens module is assembled, it must be subjected to a drop test. The main purpose is to It is to test whether the components on the lens module, especially the filter, will fall out of the lens barrel due to the impact of the drop. [0003] The current drop test system manually fixes the test piece on a solid plastic cuboid, falls f...

Claims

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Application Information

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IPC IPC(8): G01N19/00G01M11/08
Inventor 凌维成
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
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