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Error rapidly removing method for HSM fault

A memory, fast technology, applied in the direction of static memory, instrument, etc.

Inactive Publication Date: 2009-04-01
SHANGHAI MINHANG HIGH SCHOOL +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a fast troubleshooting method for high-speed memory faults, which mainly solves the existing technical problems encountered in troubleshooting intermittent memory faults, and is conducive to the normal operation of memory devices

Method used

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Embodiment Construction

[0011] The invention provides a fast troubleshooting method for high-speed memory faults, which mainly solves the existing technical problems encountered in troubleshooting intermittent memory faults, and is beneficial to the normal operation of memory devices. This method can be applied to DDR, DDR2 and fully buffered DIMM system SDRAM side debugging, the specific test scheme is different according to the connector used or whether the memory is embedded.

[0012] The main steps of the inventive method are as follows:

[0013] As a first step, determine if the fault is repetitive. Trying to make the fault condition repeat can often gain important insight into the nature of the problem.

[0014] The second step is to connect a logic analyzer with a detector or interposer on the memory bus, which can quickly understand the timing relationship, one-in-a-million error, clock quality and protocol errors of the entire DDR2 bus.

[0015] The third step is to use a high-performance o...

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Abstract

The invention relates to a fault finding method of a computer memory, in particular to a rapid troubleshooting method of a high-speed memory. In the method, whether the fault is repeatable is firstly determined, and the fault state is repeated. Secondly, a bus of the memory is connected with a logic analyzer which is provided with a detector or an interpolator, which can rapidly find out the timing relationship of the whole DDR2 bus, errors of 1 percent, the quality of the clock and protocol errors. Finally, a high performance oscilloscope with high bandwidth detection ability is used for implementing the measurement of technology parameters. The detection is implemented at a receiving end of signals. If WRITE impulses sent to the memory are required to be captured, the detection is implemented at SDRAM end. If READ impulses from the memory are required to be captured, the detection is implemented at the control end of the memory. The fault finding method mainly aims at solving technical problems met at the exclusion of intermittent memory faults and is beneficial to the normal operation of the memory.

Description

technical field [0001] The invention relates to a fault finding method for computer memory, in particular to a fast troubleshooting method for high-speed memory faults. Background technique [0002] Intermittent memory failures are complex and difficult to troubleshoot. Failures can be caused by one cause or a combination of different causes, including BIOS errors, protocol errors, signal integrity issues, hardware failures, and memory or other subsystem problems. While some engineers have quick fixes for memory troubleshooting, many engineers still have difficulty troubleshooting intermittent memory failures. Contents of the invention [0003] The purpose of the present invention is to provide a fast troubleshooting method for high-speed memory faults, which mainly solves the existing technical problems encountered in troubleshooting intermittent memory faults, and is beneficial to the normal operation of memory devices. [0004] In order to solve the above problems, the...

Claims

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Application Information

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IPC IPC(8): G11C29/56
Inventor 于洋
Owner SHANGHAI MINHANG HIGH SCHOOL
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