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Near-infrared spectrum analyzer and method for correcting resolution

A near-infrared spectrum and resolution correction technology, which is applied in the field of near-infrared spectrum analyzers and calibration, and can solve the problems of difficult application and large workload.

Inactive Publication Date: 2010-12-22
FOCUSED PHOTONICS +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These methods, like the PDS and Shenk methods, require multiple standard samples. Therefore, in the actual application of model transfer, the workload is still relatively large and the application is difficult.

Method used

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  • Near-infrared spectrum analyzer and method for correcting resolution
  • Near-infrared spectrum analyzer and method for correcting resolution
  • Near-infrared spectrum analyzer and method for correcting resolution

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0081] Such as figure 2 As shown, a near infrared spectrum analyzer includes a measuring light source such as a tungsten lamp, a spectrometer, an analysis unit, and a standard light source such as a low-pressure mercury lamp. The spectrometer includes an entrance slit, a grating, an exit slit and a detector.

[0082] The analysis unit includes the following devices (software program modules inside the analysis unit):

[0083] Optional device for selecting characteristic peaks in the spectrum;

[0084] A fitting device that can fit the characteristic peak;

[0085] A computing device that can perform calculations based on Gaussian filter functions;

[0086] A generating device that can generate Gaussian sequence according to Gaussian filter function;

[0087] Interpolation device that can interpolate the spectrum;

[0088] Convolution device that can perform convolution processing on Gaussian sequence and spectrum;

[0089] Spectral output device;

[0090] Analysis device.

[0091] This emb...

Embodiment 2

[0113] Such as Picture 9 As shown, a near-infrared spectrum analyzer, which is different from Embodiment 1, the analyzer further includes:

[0114] 1. A segmentation device that can segment the spectrum according to the location of the characteristic peak.

[0115] 2. A combination device that can combine several sections of spectra.

[0116] This embodiment also discloses a method for correcting the resolution of a near-infrared spectrum analyzer, such as image 3 As shown, including the following steps:

[0117] a. Setting steps

[0118] Set the target resolution of the spectrometer to 7.0nm, and the resolution tolerance range is 6.5~7.0nm;

[0119] b. Adjustment and processing steps

[0120] Use a standard light source such as a low-pressure mercury lamp to connect to the spectrometer, scan to obtain the mercury lamp spectrum, use a selection device to select 5 characteristic peaks in the spectrum, adjust the positions of the detector, grating, and incident slit, so that the spectrome...

Embodiment 3

[0140] A near-infrared spectroscopy analyzer, the same as in Example 2.

[0141] This embodiment also discloses a method for correcting the resolution of a near-infrared spectrum analyzer, such as image 3 As shown, including the following steps:

[0142] a. Setting steps

[0143] Divide the working band of the spectrometer into 5 sub-bands, and set the target resolution and resolution tolerance range in the 5 sub-bands, as shown in Table 3;

[0144] table 3

[0145] Sub-band

1000~1100nm

1100~1300nm

1300~1500nm

1500~1600nm

1600~1800nm

Target resolution

7.0nm

6.0nm

6.5nm

6.5nm

6.7nm

[0146] Resolution tolerance

range

6.5~7.0nm

5.3~6.0nm

5.7~6.5nm

5.7~6.5nm

6.2~6.7nm

[0147] b. Adjustment and processing steps

[0148] Use a standard light source such as a low-pressure mercury lamp (the spectrum of the low-pressure mercury lamp has characteristic peaks in the 5 sub-bands) to connect to the spectrometer, scan to obtain the mercury lamp spe...

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PUM

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Abstract

The invention discloses a method for regulating resolution of a near infrared spectrometric analyzer, which comprises the following steps: a. the setting step, target resolution and resolution tolerance limits of spectrometer are set; b. the regulating and treatment step, using the spectrometer, a spectrum of a standard light source is obtained by scanning, and the spectrometer is regulated so that the resolution thereof is within the resolution tolerance limits; the spectrum of the standard light source is treated according to the target resolution, so that resolution control information is obtained and stored, the control information can regulate the resolution of the spectrum of the standard light source to the target resolution; c. the resolution regulating step, absorption spectrum of a sample is treated by using resolution control information, so that resolution of the absorption spectrum of the sample is regulated to the target resolution; thereby regulating different near infrared spectrometric analyzers to the same. The invention also discloses a near infrared spectrometric analyzer. The invention has the advantages of small amount of work, stable reliability, convenience, practicality and the like, and is broadly applied in near infrared spectrometric analyzers.

Description

Technical field [0001] The invention relates to near-infrared spectrum analysis, in particular to a near-infrared spectrum analyzer and a calibration method. Background technique [0002] Quantitative (qualitative) analysis of samples using near-infrared spectroscopy requires an analysis model to be established first, and then the near-infrared spectroscopy of the sample is analyzed using the model to obtain the composition or content of the sample. Due to the difference in lateral wavelength, longitudinal absorbance, and analyzer resolution bandwidth between NIR spectrum analyzers, the model established on one NIR spectrum analyzer usually cannot be directly applied to another NIR spectrum analyzer , And building a model is an extremely tedious task in many application fields. Repetitive modeling work will cause a huge waste of human and material resources, and in some cases, samples may be difficult to obtain or difficult to save. Sometimes it is difficult to remodel. [0003] ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/35G01N21/31G01N21/359
Inventor 王健周新奇叶华俊冯红年
Owner FOCUSED PHOTONICS