Test method for bit error rate of MBMS UE in high speed motion state

A technology of high-speed movement and testing methods, applied in monitoring/monitoring/test arrangement, transmission monitoring, electrical components, etc., can solve problems such as center frequency offset, affecting system performance, affecting data transmission quality, etc., and achieve the effect of optimizing performance

Inactive Publication Date: 2009-05-13
ZTE CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the terminal moves at a certain speed v, due to the existence of the Doppler effect, it will have a certain impact on the frequency of the terminal, causing a shift in the center frequency, thereby causing a bit error at the receiving end due to the frequency deviation rate increases, affecting system performance
Especially when the speed is relatively high, the frequency offset will be greater, and the impact on system performance will be greater, which will affect the quality of data transmission to a certain extent

Method used

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  • Test method for bit error rate of MBMS UE in high speed motion state
  • Test method for bit error rate of MBMS UE in high speed motion state
  • Test method for bit error rate of MBMS UE in high speed motion state

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Embodiment Construction

[0021] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0022] A method for testing the bit error rate of a UE in a high-speed motion state under a TDD mode, comprising the following steps:

[0023] 1. Set the test environment parameters and frequency.

[0024] The test environment parameters here include temperature and voltage. When tested under the following temperature conditions, the UE shall be in normal working condition:

[0025] The general temperature conditions are: +15°C to +35°C (relative humidity is 25% to 75%)

[0026] Special temperature conditions are: -10°C to +55°C.

[0027] That is to say, in general, the temperature condition of the terminal test is +15°C to +35°C. c. If you need to test the per...

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Abstract

The invention provides a method for testing error rate in high-speed motion by MBMS UE, including the following steps: testing environment parameters and frequency are set; a system simulator, a noise origin and a UE are used to establish a test link; call connection is established so that a tested terminal enters a test mode; an attenuation emulator is set to be of high-speed motion; the error rate of the corresponding channel of MBMS service is measured. According to the method, the error rate of the MBMS UE in high-speed motion can be measured so that the design manufacturer of the terminal can optimize the performances of the terminal according to accurate error rate.

Description

technical field [0001] The invention relates to the field of mobile communication, in particular to a method for testing the bit error rate of an MBMS UE in a state of high-speed motion. Background technique [0002] With the popularization of mobile terminals and the extensive development of various new services based on mobile terminals, mobile terminals have increasingly become an indispensable tool for people to communicate and entertain. With the emergence of new requirements and new services (such as MBMS), higher requirements are placed on the design and performance of terminals. [0003] MBMS (Multimedia Broadcast Multicast Service) is a multimedia broadcast multicast service, and applying MBMS to UE (mobile terminal) is called mobile TV. Mobile terminals supporting MBMS services will become the most convenient tool for people to obtain information and entertainment. Based on MBMS services, users can watch news in real time and watch various TV programs anytime and...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04W24/00H04M3/22H04B17/00H04W24/06
Inventor 王曼
Owner ZTE CORP
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