Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Heat performance measuring apparatus of semiconductor lighting device

A technology of light-emitting device and measuring device, which is applied in the direction of single semiconductor device testing, measuring device, measuring electricity, etc., can solve the problem of not including optical measuring device, etc., and achieve the effects of good convection environment, good heat dissipation effect, and simple and convenient operation.

Inactive Publication Date: 2009-05-27
HANGZHOU ZHEJIANG UNIV SENSING INSTR
View PDF0 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, traditional measuring devices based on electrical measurement methods can only test electrical parameters and do not include optical measuring devices

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Heat performance measuring apparatus of semiconductor lighting device
  • Heat performance measuring apparatus of semiconductor lighting device
  • Heat performance measuring apparatus of semiconductor lighting device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Embodiment 1: semiconductor light-emitting device thermal performance measurement device, as shown in Figure 1 and image 3 As shown, it includes a base 8, an optical measurement device and a temperature control device located on the base 8, an electric drive and a measurement circuit electrically connected to the optical measurement device and the temperature control device, and the optical measurement device and the temperature control device are up and down. Arrangement, the electric driving and measuring circuit can be electrically connected with the DUT 4 .

[0025]The light measuring device comprises a photometric integrating sphere 3-1, a light detection device matched with the photometric integrating sphere 3-1, an auxiliary illuminant 7 arranged in the photometric integrating sphere 3-1, and a photometric integrating sphere 3-1 There is a light-transmitting detection installation hole 9 on the side wall, and a light-receiving hole 10 is opened on the lower wall....

Embodiment 2

[0029] Embodiment 2: A device for measuring thermal performance of semiconductor light-emitting devices. As shown in FIG. -3 Cooperating guide rail sliding sleeve 6-2, connecting frame 6-1 fixedly connected with guide rail sliding sleeve 6-2, the temperature control device is arranged on the connecting frame 6-1, and the translation stage can be driven by a motor or manually Control up and down motion.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a thermal property measurement device for a semiconductor luminescent device to measure junction temperature, thermoresistance and the like thermal property parameters of the semiconductor luminescent device, which can be matched with other tested components and comprises a light measurement device, a temperature control device, and an electric driving and measuring circuit electrically connected with the light measurement device and the temperature control device; wherein the light measurement device and the temperature control device are arranged up and down; and the electric driving and measuring circuit can be electrically connected with the tested components. The device has the remarkable progress that: 1. as the light measurement device and the temperature control device are arranged up and down, when the semiconductor luminescent device is picked and placed on the device, the opposite position of the light measurement device and the temperature control device can be adjusted, the operation is simple and convenient; 2. a photoelectric measuring instrument can accurately measure light quantity, radiation measurement and the like light parameters; 3. a radiator has reasonable structure, favorable convection environment during work and good radiation effect; 4. a positioning measurement device is arranged for measuring the opposite position of the light measurement device and the temperature control device, which can avoid abnormal operation occurrence.

Description

【Technical field】 [0001] The invention relates to a measuring device, in particular to a thermal performance measuring device for a semiconductor light emitting device used for measuring thermal performance parameters such as junction temperature and thermal resistance of the semiconductor light emitting device. 【Background technique】 [0002] Junction temperature and thermal resistance are one of the most important performance indicators to measure semiconductor light emitting devices and application products. The core of a semiconductor light-emitting device is the PN junction, the junction temperature refers to the temperature of the PN junction, and the thermal resistance refers to the ratio of the temperature difference between two points to the dissipated thermal power. The thermal performance measurement of a semiconductor light-emitting device is mainly to measure the PN junction to The thermal resistance of the case. The PN junction is located inside the semiconduc...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/00G01R31/26G01R31/265
Inventor 牟同升
Owner HANGZHOU ZHEJIANG UNIV SENSING INSTR
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com