Height difference measuring method and digital device
A technology of height difference and measuring instrument, applied in the field of measurement, can solve the problems of expensive instrument, inconvenient to carry, time-consuming, etc., and achieve the effects of improving measurement efficiency, digitizing information, and low development cost
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0054] Embodiment 1: comprise the following steps in turn:
[0055] (1) The instrument is set between A and B, and an observation point 0 is arbitrarily selected.
[0056] (2) The same 3-meter ruler is erected on terrain A and terrain B respectively (or the ruler is moved to point B after the measurement at point A is completed), there are two observation marks on the ruler, and the mark at 0.7 meters below the ruler point as base high H 0.7 , the mark point at the upper 3 meters of the ruler is the fixed height H 3
[0057] (3) At 0 point, first observe the two marker points of the A terrain scale, and measure the basic high point H 0.7 , the fixed high point H 3 The line-of-sight inclination θ A0.7 , θ A3 .
[0058] (4) Then observe the two marker points of the B terrain scale at 0, and measure the base high point H 0.7 , the fixed high point H 3 The line-of-sight inclination θ B0.7 , θ B3 .
[0059] (5), let the horizontal distance between A and 0 be S AO , the...
Embodiment 2
[0070] Embodiment 2: comprise the following steps in turn:
[0071] (1) The instrument is set between A and B, and an observation point 0 is arbitrarily selected.
[0072] (2) Erect the same 2-meter ruler on terrain A and terrain B respectively (or move the ruler to point B after measuring at point A). There are two observation marks on the ruler. The lower part of the ruler is at a height of 0.4 meters. Mark point as base high H 0.4 , the upper 2m mark point of the ruler is the fixed height H 2
[0073] (3) At 0 point, first observe the two marker points of the A terrain scale, and measure the basic high point H 0.4 , the fixed high point H 2 The line-of-sight inclination θ A0.4 , θ A2 .
[0074] (4) Then observe the two marker points of the B terrain scale at 0, and measure the base high point H 0.4 , the fixed high point H 2 The line-of-sight inclination θ B0.4 , θ B2 .
[0075] (5), let the horizontal distance between A and 0 be S AO , the horizontal distance ...
Embodiment 3
[0086] Embodiment 3: comprise the following steps in turn:
[0087] (1) The instrument is set between A and B, and an observation point 0 is arbitrarily selected.
[0088] (2) Erect the same 3-meter ruler on terrain A and terrain B respectively (or move the ruler to point B after measuring at point A). There are two observation marks on the ruler. The lower part of the ruler is 0.4 meters high. Mark point as base high H 0.4 , the 3-meter mark point on the upper part of the ruler is the fixed height H 3
[0089] (3) At 0 point, first observe the two marker points of the A terrain scale, and measure the basic high point H 0.4 , the fixed high point H 3 The line-of-sight inclination θ A0.4 , θ A3 .
[0090] (4) Then observe the two marker points of the B terrain scale at 0, and measure the base high point H 0.4 , the fixed high point H 3 The line-of-sight inclination θ B0.4 , θ B3 .
[0091] (5), let the horizontal distance between A and 0 be S AO , the horizontal di...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com