Method for implementing matching test for automatic test equipment

Abstract

The invention discloses a method for an automatic test device to realize a matching test. The method comprises the following steps: the first step: forming a text vector comprising a plurality of repetitive vector sections, each of which comprises an input and a corresponding expected output of a circuit to be detected; the second step: running the text vector for the circuit to be detected by the automatic test device, comparing an actual output with the expected output and outputting a comparison result in terms of a file; and the third step: analyzing an output file: the matching test is proved to be successful if the actual output of at least one vector section is identical with the expected output, or else, the matching test is proved to be unsuccessful. The method can cause the automatic test device having no or only having a simple matching test function to realize the matching test function, thus meeting test requirements of some special chips and expanding the application ranges of the automatic test device.

Description

technical field [0001] The invention relates to a testing method of an automatic testing equipment, in particular to a testing method of an automatic testing equipment for a clock asynchronous circuit. Background technique [0002] Digital circuits are tested by means of test vectors, which consist of an input and an expected output corresponding to that input. For a test vector, the input in it is used as the input of the circuit under test. If the actual output is consistent with the expected output, it means that the test is passed; otherwise, it means that the test fails. Usually, the input or output of the circuit to be tested can be represented by a 1-bit or n-bit binary number. In the worst case, an n-input combinational circuit requires 2n test vectors to exhaust all possible inputs. [0003] For some special digital circuits, such as clock asynchronous circuits, there may be many different outputs for the same input, so it only needs to appear at least one expecte...

AI Technical Summary

Problems solved by technology

[0004] Among the existing automatic test equipment (ATE, Automated Testing Equipment), some have no matching test function at all, and some only have a simple matching test function, such as limiting the same input The number of matching tests, etc., which has caused great constraints on the chip test

If automatic test equipment with complete matching test functions is used, high purchase and maintenance costs are required, and the operation is also complicated and cumbersome

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