Laser cleaning system and method thereof

Abstract

The invention relates to a laser cleaning system, which is applicable to cleaning dirt on a probe of a probe fixture. The laser cleaning system comprises a recognition unit, a processing unit which is connected with the recognition unit, and a laser generating unit which is at least driven by the processing unit. The recognition unit is erected at a corresponding position of the probe fixture, so as to recognize at least one probe to be cleaned on the probe fixture and obtain a recognition signal corresponding to the position of the probe to be cleaned; the processing unit receives the recognition signal and generates a driving signal; the laser generating unit is driven by the driving signal, thereby projecting at least one laser beam on the probe to be cleaned. The laser cleaning system of the invention can employ laser projection method to clean a certain probe to be cleaned on the probe fixture, thereby effectively increasing cleaning efficiency, reducing unnecessary laser energy waste and avoiding damage of the probe or peripheral structures.

Description

technical field [0001] The invention relates to a cleaning system for a probe fixture, especially a system for cleaning the probe fixture by projecting laser light on a probe to be cleaned. Background technique [0002] After the traditional manufacturing of printed circuit boards (Printed Circuit Board, PCB) or integrated circuits (Integrated Circuit, IC), etc., they will use probe fixtures to check whether their circuits are normal, and then send the products to the downstream market to reduce market recycling. product possibilities. The probe fixture is provided with a conductive probe relative to the position of the circuit on the circuit board. When the two are in contact, they cause an electrical connection and form a conduction signal. Through the analysis of the conduction signal, the circuit of the circuit board can be detected. Whether the structure is normal. [0003] In industrial manufacturing, the output of such products is quite large, and the probe fixture ...

AI Technical Summary

Problems solved by technology

Although the use of laser radiation can effectively remove dirt without direct contact with the probes, which can avoid damage to the structure of the probes, but the cleaning method shown in this patent can only judge which probe cards are in wrong contact, and then still It is necessary to manually judge which probes in the probe card need to be cleaned or fully cleaned. If the number of probes to be cleaned is large, it will also increase the trouble and time of the staff

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