Single particle upset and single particle transient pulse resisiting D trigger

Abstract

The invention relates to a D trigger used for single particle upsetting resistance and single particle transient pulse in the technical filed of an integrated circuit, comprising two multichannel switches, two delay circuits, two protecting gate circuits and three inverters; wherein, the multichannel switches are used for forming a feedback loop for latching data; the delay circuits are used for generating signals in delay modes; the protecting gate circuits are used for filtering voltage transient fluctuation of the input signals; in the feedback loop of the D trigger, data input signal D and the delayed mode thereof enter the protecting gate circuit; and the output signals of the protecting gate circuit filter the delayed voltage transient fluctuation of the data input signal D and the width of the voltage transient fluctuation is not wider than the delay of the delay circuit. The invention can be applied to application occasions needing higher radiation resistance, leads the single particle upsetting resistance and single particle transient pulse performance of D trigger to reach the same level as a time sampling D trigger; and simultaneously, the increasing of the unit area is less than that of the time sampling D trigger and the working speed is superior to that of the time sampling D trigger.

Description

technical field [0001] The invention relates to a D flip-flop used in the technical field of integrated circuits, in particular to a D flip-flop resistant to single-event reversal and single-event transient pulse. Background technique [0002] The single event effect is a major radiation effect in integrated circuits used in aviation, aerospace and other fields. The D flip-flop is one of the most common units in a sequential logic circuit, and the ratio of the D flip-flop to the total area of ​​an ASIC (Application Specific Integrated Circuit) chip can reach 20-40%. For contemporary integrated circuits, the single-event effects that affect D flip-flops are mainly single-event upsets and single-event transient pulses. Therefore, the anti-single-event flipping and single-event transient pulse hardening of the D flip-flop can effectively improve the anti-radiation performance of the entire chip and system. [0003] After searching the literature of the prior art, it was found...

AI Technical Summary

Problems solved by technology

The disadvantage is that more delay and voting circuits are used, resulting in a larger increase in unit area

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