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Light reflection differential method for testing component with small hole in biochip device and testing method thereof

A biochip, technology with poor light reflection

Inactive Publication Date: 2012-07-04
北京物科光电技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In other words, the distance between the biological sample point and the sample point is only tens of microns. Obviously, it is impossible to use the above-mentioned elongated light spot of hundreds or even thousands of microns to detect. Therefore, it is difficult to use the existing optical reflectance difference method. High-throughput detection of biochips

Method used

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  • Light reflection differential method for testing component with small hole in biochip device and testing method thereof
  • Light reflection differential method for testing component with small hole in biochip device and testing method thereof
  • Light reflection differential method for testing component with small hole in biochip device and testing method thereof

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0030] refer to figure 1 , The light reflection difference method device adopts the conventional one, for example, the device provided by the patent No. ZL03153938.6.

[0031] Laser 1 of the device uses an output wavelength of 6328 , 5mW, s-polarized He-Ne laser; Pokes cell 3 selects the Pokes cell product of Newport Company; analyzer 4 selects a polarizer; lens 5 is a glass lens with a focal length of 10 cm, and detector 6 selects silicon The photodiode is used as light; the amplifier 7 is a lock-in amplifier; the computer system 8 is a computer system capable of data acquisition and processing; the sample stage 9 is a two-dimensional scanning sample stage.

[0032] First make a small hole part 10, get a 1mm thick alloy aluminum plate, make a small hole 17 with a diameter of 0.5mm on it, then boil the alloy aluminum plate with the small hole black to make the small hole part 10, put the small hole part 10 is installed on a 360-degree rotatable adjustment frame for adjusting...

Embodiment 2

[0039] First make a small hole part 10, get a 0.5mm thick steel plate and make a small hole 17 with a diameter of 0.3mm, then boil the steel plate with the small hole black to make the small hole part 10, and install the small hole part 10 on a On the adjustable frame that can be rotated 180 degrees, and through it to adjust the angle of the small hole, the shape and size of the probe light spot can be adjusted.

[0040] Carry out by the detection method of embodiment 1, just the pinhole part 10 is arranged in the optical path between the laser 1 and the photoelastic modulator 2 of the optical reflection difference method device, the angle between the pinhole and the incident light is adjusted to oblique The incident angle of the incident light is used to detect the antigen and antibody as the biological sample 15 .

Embodiment 3

[0042] According to Embodiment 2, the small hole component 10 is placed in the optical path between the lens 5 and the detector 6 of the optical reflectance difference method device.

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Abstract

The invention relates to a light reflection differential method for testing a component with a small hole in a biochip device, and a testing method thereof. The component with a small hole is a non-transparent metal block or a plastic flat plate with a small hole; the size of the small hole is designed according to the size and shape of a light spot of testing light required by testing, and the component with a small hole is installed on an adjusting seat which can rotate by 90 degrees to 360 degrees. The testing method comprises the following steps: the component with a small hole is arranged in the incidence path of a device adopting the light reflection differential method; an incidence light penetrates the small hole which can rotate vertically around the central line of the light beam and the incidence plane of the light; and the shape of the light spot entering the surface of the biochip to be tested is adjusted by a method of changing the shape of the incidence light beam, thereby being capable of detecting biological specimen spots of only tens of microns, truly recording information thereof, overcoming the defects that an inclined incidence light reflection differential method causes the light spot entering the surface of a specimen to be prolonged and enlarged and the high-flux testing of biological chip samples is difficult, and realizing the high-flux testing of the biochip.

Description

technical field [0001] The present invention relates to a device and method for an oblique incident light reflection difference method, in particular to a small hole component and a detection method in a device for detecting biochips using an oblique incident light reflection difference method Background technique [0002] Oblique incident light reflection difference method is a new non-contact, non-damaging and high-sensitivity detection method developed in recent years. It can not only obtain real and imaginary signals at the same time, but also has high sensitivity Spatial and temporal resolution. For the first time, we have developed the in-situ real-time detection method of oblique incident light reflection difference method for the atomic-scale epitaxial growth of oxide films, and have been authorized two patents for invention and utility model (patent number: ZL97219032.1; ZL97 1 21997.4; ZL03153938.6 ; Zl03276452.9). On this basis, we and our collaborators have car...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/17G01N33/48C12Q1/00
Inventor 吕惠宾温娟陆珩金奎娟周岳亮杨国桢
Owner 北京物科光电技术有限公司