Deep layer section soil sampler and sampling method thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- HOHAI UNIV
- Publication Date
- 2009-12-09
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the fields of ecological research such as soil science and environmental science, and is suitable for the technical field of collecting deep soil profile samples. Background technique
[0002] Soil has a very important research status in many disciplines such as soil science, environmental science, geology, geotechnical science, and ecology. It is very important to collect scientific soil samples according to the purpose of the experiment. During the collection of soil samples, researchers try to keep the soil as undisturbed as possible, and hope to learn more about the deep profile of the soil. Many soil studies include the study of deep soil samples. In the collection of deep soil samples, how to reduce the interference to soil samples and minimize the amount of earth excavation to obtain deep soil samples has been a problem that has puzzled researchers for a long time.
[0003] In the process of collecting deep soil samples...