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Method for applying commercial on-spot programmable device to triple-modular redundancy anti-irradiation in irradiation environment

A technology of triple-mode redundancy and irradiation environment, applied in the field of commercial FPGAs, can solve the problems of anti-irradiation soft errors, etc., and achieve the effect of wide representativeness and practicality

Inactive Publication Date: 2009-12-30
FUDAN UNIV
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Problems solved by technology

[0007] The technical problem to be solved by the present invention is to seek a kind of commercial field programmable device FPGA based on the look-up table structure to be used in the irradiation environment, to alleviate the problem of single event flipping caused by such commercial FPGA chips due to the irradiation environment, and hereby Based on the study of a general logic three-mode redundancy anti-irradiation soft error algorithm

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  • Method for applying commercial on-spot programmable device to triple-modular redundancy anti-irradiation in irradiation environment
  • Method for applying commercial on-spot programmable device to triple-modular redundancy anti-irradiation in irradiation environment
  • Method for applying commercial on-spot programmable device to triple-modular redundancy anti-irradiation in irradiation environment

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Embodiment Construction

[0043] Please refer to the accompanying drawings for a further description of the present invention.

[0044] The present invention provides a commercial field programmable device FPGA used in a three-mode redundancy anti-irradiation method in an irradiation environment. The circuit designed by the user is mapped to the commercial FPGA chip and classified into four types of logic, namely: input logic, non-feedback logic, feedback logic, and output logic. For the four different logical classifications, different three-mode redundancy anti-irradiation processing is performed respectively.

[0045] Figure 5 The user-designed circuit (before triple-mode redundancy) in the four logics are: (1) input logic A, B and CLK, (2) non-feedback logic 101, (3) feedback logic (including combinational logic 102 and sequential unit 103) and (4) output logic X.

[0046] Image 6 for Figure 5 Logic diagram after triple redundancy.

[0047] Figure 7 Enter logic and non-feedback logic sec...

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Abstract

The invention relates to a method for applying a commercial on-spot programmable device to triple-modular redundancy anti-irradiation in an irradiation environment based on lookup table structure and a generic algorithm thereof, aiming at easing the problem that commercial FPGA chips are prone to cause overturning of programming point single particle in the irradiation environment due to irradiation energy energetic particles in the space. The method carries out classification according to user circuit logical type; the first type is input logic, the second type is non-feedback logic and the third type is feedback logic, the fourth type is output logic. In the method of the invention, different triple-modular redundancy anti-irradiation processing methods are proposed with regards to the 4 types of logic. The method of the invention is a universal method through which various user circuits are mapped to the commercial FPGA, features widespread representativeness, generality and practicability.

Description

technical field [0001] The invention belongs to the technical field of EDA (Electronic Design Automation) of Field Programmable Gate Array (FPGA), and specifically relates to a commercial FPGA based on a look-up table structure in an irradiation environment, by adopting triple-mode redundancy to resist irradiation The method and its general algorithm can alleviate the soft error problem of single event flipping caused by irradiation. Background technique [0002] A commercial FPGA based on a look-up table structure consists of a large number of programmable logic resources. The energy particles existing in space will produce Single Event Effects (SEE) on such FPGA chips. When a single energy particle hits the SRAM programmable point to form enough energy, a single event reversal effect Single Event Upset (SEU) will occur. Single-event upsets may cause changes in the logic state of devices such as look-up tables, register units, and RAMs, resulting in inconsistent logic fun...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G06F11/18
Inventor 杨萌邵海波童家榕
Owner FUDAN UNIV
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