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Device allocation method in automatic test system

A technology for automated testing and equipment allocation, applied in the direction of resource allocation, multi-program installation, etc., can solve the problems of test equipment not being able to be released normally, testing cannot be used, resource waste, etc., to reduce manual cleaning of "false occupation" equipment. work, save labor costs, and improve the effect of equipment utilization

Active Publication Date: 2010-04-14
MAIPU COMM TECH CO LTD
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Problems solved by technology

At present, there is such a problem in this equipment management method: when the test process is manually interrupted or exits abnormally due to other reasons, the abnormal end of the test process will make the test equipment unable to be released normally, so that these equipment will be occupied for a long time The false impression that cannot be used for other tests, resulting in a waste of resources

Method used

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  • Device allocation method in automatic test system
  • Device allocation method in automatic test system

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Embodiment Construction

[0014] The technical solutions of the present invention will be described in detail below with reference to the accompanying drawings.

[0015] Assuming that the name of the folder used to store device files in the test system is A, the current test process P needs to allocate a device under test. First, the test system selects a device under test DUT that can be used for the test process P, and then checks the folder Whether there is a device file DUT with the same name under A, if there is no device file DUT, create a device file DUT with the same name under folder A, and save the process ID of the test process P to the device file of the device DUT, and then the test process P will The device DUT can be occupied for related tests. If the device file already exists, the process ID in the device file DUT is taken out, and it is judged whether the process corresponding to the process ID exists. There are two cases: Case 1, the process corresponding to the process ID in the de...

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Abstract

The invention relates to a device allocation method in an automatic test system, aiming to solve that devices can not be recovered to be used in time when the test progress is interrupted abnormally. The technical proposal of the invention is that a file created on a master control device is used to store a device document of an occupied device, the test progress creates a relative device document in the file when a device is occupied by the test progress, and the test progress ID of the occupied device is stored in the device document. When the test progress is started, the content of the device document in the file is adopted to determine whether the device is occupied or not, the device can be occupied if the device is not occupied, and another device should be applied for if the device is occupied. When the test task is completed, the device document of the device is removed, and the test progress is finished. The device allocation method in the automatic test system is applied toregression tests, and can increase the utilization ratio of tested devices and auxiliary test devices in automatic environments.

Description

technical field [0001] The present invention relates to a method for distributing equipment (including equipment under test and auxiliary testing equipment) in an automated testing system, in particular to a method for actively recycling equipment in an automated testing system. Background technique [0002] With the development of data communication technology, the competition in technology and cost among various data communication products has intensified. How to shorten the development cycle and development cost of equipment on the basis of ensuring product quality has become a joint effort of communication equipment manufacturers to explore The problem. During the R&D process or the maintenance process of the software version after the product is released, it takes a lot of manpower to complete dozens or even hundreds of rounds of regression testing. The so-called regression test refers to the verification test of the correctness of the software by finding and modifying...

Claims

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Application Information

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IPC IPC(8): G06F9/50
Inventor 郭静董哲
Owner MAIPU COMM TECH CO LTD
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