Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Integrated management system and integrated management method for research and development of instruments

A technology of instrumentation and integrated management, applied in the field of management informatization, can solve problems such as scattered management of product technical data, backward product R&D management methods, and chaotic management

Inactive Publication Date: 2010-04-21
CHONGQING UNIV +1
View PDF2 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide an integrated management system and method for the research and development of instruments and meters, which has the characteristics of high integration, flexible management, and convenient use, and can Effectively solve the problems of chaotic product R&D process management, decentralized product technical data management and backward product R&D management methods in domestic instrumentation companies

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Integrated management system and integrated management method for research and development of instruments
  • Integrated management system and integrated management method for research and development of instruments
  • Integrated management system and integrated management method for research and development of instruments

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0087] like figure 1 , figure 2 , image 3 and Figure 4 As shown, an integrated management system for the research and development of instruments and meters includes three parts: client system, application server, and data server, which are connected and communicated through a computer network; the computer network uses Transmission Control Protocol and Internet Protocol (TCP / IP) corporate intranet (Intranet).

[0088] The client system includes a computer, user interface software and development tool software installed on the computer, and a personal knowledge base stored on the computer. The computer is a Founder Zunyue A360 commercial machine, and the operating system Windows XP Standard Edition is installed. The user interface software is based on Microsoft.NET Framework 2.0, and it is a Windows application program developed and realized by programming in C# language. The running effect is as follows: Figure 8 Shown; Through human-computer interaction, flow manage...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an integrated management system and an integrated management method for the research and development of instruments, and relates to a system and a method for realizing the informatization on the management of the research and development of the instruments. The integrated management system comprises three main parts of a client system, an application server and a data server; and the integrated management method utilizes the integrated management system to integratedly manage the research and development of the instruments through a program. The system and the method have the advantages that the system and the method can help instrument enterprises to effectively carry out product design and development requirements stipulated in ISO9001 quality management system documents, can perform the standard management of the research and development service flow of the instruments, can help the instrument enterprises to strengthen the management of technical data and can improve the management level of the research and development of products of the instrument enterprises. The integrated management system and the integrated management method have the characteristics of high integration level, flexible management, convenient use and the like. The integrated management system and the integrated management method can be widely applied to the management of the research and development of embedded products, and is particularly suitable for the management of the research and development of the instruments.

Description

technical field [0001] The invention belongs to the technical field of management informatization, and in particular relates to a system and method for realizing informatization of instrument research and development management. Background technique [0002] With the rapid development and wide application of embedded technology, instrumentation has changed from "pure hardware" to "hardware + software"; and the "hardware + software" method is also changing from "hardware + low-level programming language" to "hardware + embedded Systematic operating system + high-level programming language" development. Use the method of "hardware + embedded operating system + advanced programming language" to develop instruments and meters, involving embedded CPU selection, embedded operating system selection and transplantation, peripheral circuit design, functional module design, PCB circuit board production, mechanical structure design , Algorithm design, software programming, system test...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/00G06Q10/06
Inventor 蔡章利张军石为人刘进范敏许磊蒋霄杨幸坤张跃火庞蓓蓓
Owner CHONGQING UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products