Automatic exposure method based on analogous column diagram

An automatic exposure and histogram technology, applied in image communication, color TV parts, TV system parts, etc., can solve the problems of complex statistics and different brightness, and achieve the effect of good convergence

Inactive Publication Date: 2010-07-21
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF5 Cites 46 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A method and control system for automatic exposure adjustment (China, 200510080327.5) proposes to adjust the image exposure intensity value to the target exposure intensity value range. Since the target size and shape are different under the same illuminance, the brightness of the target is also different. Therefore, this method The application has certain limitations; the metho

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic exposure method based on analogous column diagram
  • Automatic exposure method based on analogous column diagram
  • Automatic exposure method based on analogous column diagram

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] Such as figure 1 As shown, the automatic exposure control system is a closed-loop control system, which mainly includes three modules: target gray level statistics, comparison judgment with expected value, and exposure time calculation. The target grayscale statistical module receives the image data output by the image sensor and counts the grayscale mean value of the target according to the algorithm. After an image is counted, compare the grayscale mean value with the expected value to see if it meets the requirements. If it meets the requirements, wait for the next frame of image data; if the requirements are not met, a new exposure time is calculated based on the difference between the gray mean value and the expected value and fed back to the image sensor. After many times of "statistics-judgment-calculation-feedback image sensor-statistics" closed-loop system to meet the expected value requirements, in this process, you can choose to output images or not output im...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an automatic exposure method based on an analogous column diagram, which has favourable exposure effect on various situations, such as dark background light target, target size uncertainty and the like in deep space exploration. An automatic exposure control system is a closed loop control system and mainly comprises three modules: target gray level statistics, comparative judgment with expected values and exposure time calculation; data statistics analysis is carried out by gray scale region division, gray scale value weighting average calculation and the like so as to determine exposure required by shooting. Because of having low requirement on hardware, the invention can be suitable for different hardware platforms by slightly modifying, and can balance calculation speed, logic resource use, system time sequence requirement and the like according to the practical situation so as to choose different control modes.

Description

technical field [0001] The invention relates to an automatic exposure method based on a histogram-like image, in particular to an automatic exposure adjustment method for an image sensor (CCD, CMOS). In addition to conventional target environments, it can also be widely used in dark background bright targets, targets with different sizes and positions Determined detection objects (such as deep space exploration, etc.). Background technique [0002] Exposure is a physical quantity used to calculate the luminous flux from the subject to the camera. The luminous flux reaching the CCD / CMOS sensor is mainly determined by two factors: the length of the exposure time and the size of the aperture value. With a certain aperture, proper image brightness can be achieved by changing the length of the exposure time or changing the gain of the image sensor, but the change of the gain will introduce noise to the image accordingly, which complicates the subsequent processing work. The exp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H04N5/235
Inventor 曹剑中张海峰王华伟唐垚祝青
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap