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Two-dimensional spectrum measuring device

A measurement device and two-dimensional spectrum technology, applied in the field of optical radiation measurement, can solve problems such as detector spectral mismatch error, low measurement accuracy, and aggravated detector spectral mismatch error, achieving high repeatability and convenient measurement operation Effect

Inactive Publication Date: 2013-01-09
HANGZHOU EVERFINE PHOTO E INFO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

On the one hand, this method will have a detector spectral mismatch error, and because there is a difference in the relative spectral sensitivity of a pixel on the surface of the array detector, this difference will further aggravate the spectral mismatch error of the detector, resulting in the final measurement accuracy On the other hand, this method cannot obtain the spectral information of the measured light source, so it cannot perform detailed photochromatic analysis on the measured light source

Method used

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Examples

Experimental program
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Effect test

Embodiment 1

[0028] Such as figure 1 As shown, this embodiment includes a casing 1 on which a lens 2 is arranged, and the measured light beam of the measured two-dimensional object 20 enters the casing 1 from the lens 2 . A spectrometer 7 is arranged inside the casing 1, and the spectrometer has a slit 4 at an angle of 45 degrees to the horizontal direction, and the slit 4 is a light-emitting mirror with a rectangular slit in the middle. A part of the beam incident from the lens 2 passes through the slit 4 and enters the inside of the spectrometer 7 for spectroscopic measurement, while the other part of the beam is reflected to an observer 3, and the observer 3 is a visual system 3, and the visual system 3 also has an optical reflector 3-1 and an eyepiece 3-2 for changing the optical path, and the human eye 9 detects the image of the two-dimensional target 20 through the visual system 3 . In the spectrometer of this embodiment, a dispersive component 5 and a two-dimensional multi-channel ...

Embodiment 2

[0032] Such as figure 2 As shown, the basic structure of this embodiment is similar to Embodiment 1, but in this embodiment, the observer 3 is not a visual system, but a two-dimensional observation CCD 3, that is, the light beam reflected by the slit and Instead of entering the visual system to be observed by the human eye, but as figure 2 As shown, a two-dimensional observation CCD 3 is entered through a secondary optical imaging device 3 - 2 , and the secondary optical imaging device 3 - 2 re-images the light imaged on the slit 4 onto the two-dimensional CCD 3 . Both the two-dimensional observation CCD 3 and the two-dimensional multi-channel detector 6 of the spectrometer 7 are electrically connected to the microprocessor 10 in the housing 1 . At the same time, a display screen 13 is also provided on the casing 1 , and the display screen is also electrically connected to the microprocessor 10 .

[0033] Similar to Embodiment 1, when the two-dimensional spectrum measureme...

Embodiment 3

[0035] Such as image 3 As shown, this embodiment includes a casing 1 , on which a lens 2 is arranged, and the measured light beam of the measured two-dimensional object 20 enters the casing 1 from the lens 2 . A beam splitter 11 is arranged on the optical path behind the lens in the casing 1, and the beam splitter 11 is a plane beam splitter 11 that is partially transmitted and partially reflected, and the reflected light of the plane beam splitter 11 is received by an observer 3, so The observer 3 is a two-dimensional observation CCD 3, and the transmitted light of the plane beam splitter 11 is directed to the vertical slit 4 of the spectrometer 7. Both the slit 4 and the two-dimensional observation CCD 3 are located on the phase plane where the measured two-dimensional object 20 is imaged by the lens, forming an optical conjugate relationship. The slit 4 only allows the light emitted by a column of light sources in the measured two-dimensional target 20 to enter the spectr...

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Abstract

A two-dimensional spectrum measuring device includes a machine case (1), a observation device (3), a spectrometer (7) and a scanning mechanism (8). The measured light beam of a measured two-dimensional target (20) enters the machine case from a lens (2) and is divided into two measured light beams. The two measured light beams are received by the observation device and the spectrometer in the machine case, respectively. The observation device is used for being aligned with the measured target and / or measuring the image brightness information of the measured target. The spectrometer includes a slit (4), a chromatic dispersion component (5) and a two-dimensional multi-passage detector (6); the spectrum distribution of each point in a line / row (21) can be obtained through each measurement. The scanning mechanism is arranged in or on the machine case, thereby enabling a relative displacement between the slit and the image surface of the measured two-dimensional target to be generated.

Description

【Technical field】 [0001] The invention relates to the field of optical radiation measurement, in particular to a spectrum measurement device integrating image and spectrum measurement. 【Background technique】 [0002] Brightness and color parameters directly reflect the perception of light by the human eye, and are widely used in the fields of flat panel display, lighting engineering, and light source design. In the field of flat panel display, etc., it is necessary to investigate the luminance, chromaticity and other light and color spectrum information of each point in the two-dimensional plane of the light source under test. At present, the commonly used equipment for measuring these parameters includes aiming point luminance meters and image luminance meters. The aiming-point luminance meter can only measure the luminance and chromaticity of one point at a time, and the efficiency of measuring the entire two-dimensional plane is relatively low. The image-type luminance m...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28G01J1/42G01J3/50
CPCG01J3/0291G01J3/0248G01J3/2823G01J3/06G01J3/02
Inventor 潘建根
Owner HANGZHOU EVERFINE PHOTO E INFO