Method and arrangement for unaffected material analyse
A technology of area and tactile sensors, applied in material excitation analysis, material analysis using sound wave/ultrasonic wave/infrasonic wave, material analysis through optical means, etc., can solve problems such as destroying materials and changing materials
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[0008] The basic idea of the invention is to make it possible to combine the detection of harder or softer regions 1 in the material 2 with the directly occurring material analysis of the measured regions. This will be performed directly in the material without any form of sampling, without removing any material. This results in the impact on the material being kept to a minimum and it makes it possible to avoid future material changes caused by material removal. This will hereinafter be referred to as "unaffected material analysis". It should be possible to carry out this method by means of the same device 3, which is also the basic idea.
[0009] A method according to the invention is to be used in an unaffected material analysis process for detecting and analyzing at least one region 1 of a material 2 having a hardness different from other materials (material deviation) where the basic properties of the material 2 ( desired properties) are known.
[0010] The method in...
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