Method for manufacturing p-n junction of Ge/Si solar battery by dipping method
A solar cell, n-type technology, applied in the direction of sustainable manufacturing/processing, circuits, electrical components, etc., can solve the problems of high risk of silane gas, difficulty in industrialization, high consumption of waste gas treatment, etc., to save silicon germanium raw materials, Effect of improving photoelectric conversion efficiency and improving productivity
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example 1
[0026] Example 1: Add n-type polysilicon and a certain proportion of Ge in the temperature control pot 6, so that the atomic percentage of Ge content in its Si-Ge alloy solution 5 is 20%, and then close the whole system, and the whole system is kept under high-purity argon gas Environment. Heat the temperature control pot, fully dissolve the n-type polysilicon and an appropriate amount of Ge, and keep the temperature of the Si-Ge alloy solution at 1450°C. The holder clamps the p-type polysilicon, and preheats the free end surface of the p-type polysilicon substrate. The preheating temperature is 1200°C, the depth of its entry into the liquid Si-Ge surface is controlled at 0.2 mm, and the dipping time is 0.3 seconds. In order to ensure that the thin layer of Si-Ge alloy solution dipped on the p-type polysilicon substrate is not rapidly solidified, the p-type polysilicon substrate dipped in the n-type Si-Ge alloy solution is quickly moved to the cooling system and slowly cooled ...
Embodiment 2
[0027]Embodiment 2: other conditions are the same as embodiment 1, make the atomic percent of Ge content in its Si-Ge alloy solution be 40%, n-type Si-Ge alloy solution temperature is controlled at 1475 ℃, p-type polysilicon substrate preheating temperature reaches 1100°C, the p-type polysilicon substrate is quickly dipped into the n-type Si-Ge alloy solution, the depth of entering the liquid surface is controlled at 0.4mm, the dipping time is 0.4 seconds, and then quickly put into the cooling system for directional solidification, so that the temperature drops to At 1100°C, there will be a Ge-enriched layer on the surface with a thickness of 145 μm, and the buffer layer Si 1-x Ge x (0
Embodiment 3
[0028] Embodiment 3: other conditions are the same as embodiment 1, make the atomic percent of Ge content in its Si-Ge alloy solution be 60%, n-type Si-Ge alloy solution temperature is controlled at 1480 ℃, p-type polysilicon substrate preheating temperature reaches 1000°C, the p-type polysilicon substrate is quickly dipped into the n-type Si-Ge alloy solution, the depth of entering the liquid surface is controlled at 0.6mm, the dipping time is 0.7 seconds, and then quickly put into the cooling system for directional solidification, so that the temperature drops to At 1000°C, a Ge-rich layer will be enriched on its surface, with a thickness of 196 μm, and the buffer layer Si 1-x Ge x (0
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