Thermal contact resistance test equipment

A technology of contact thermal resistance and testing equipment, applied in thermometers, measuring devices, measuring heat and other directions using electrical/magnetic components directly sensitive to heat, can solve problems such as unpractical engineering, large errors, and many parameters, and avoid error, improve work efficiency, avoid the effect of lateral heat flow loss

Inactive Publication Date: 2010-12-08
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, these methods have many parameters and large errors, which are not practical in engineering

Method used

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  • Thermal contact resistance test equipment
  • Thermal contact resistance test equipment
  • Thermal contact resistance test equipment

Examples

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Embodiment Construction

[0022] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0023] The invention provides a method for testing thermal contact resistance. The testing method utilizes the characteristics of temperature change of heat flow transmitted between different material interfaces to detect thermal contact resistance of the interface. Therefore, this method is relatively simple, reliable, and has high measurement accuracy and is easy to use. Operational test equipment will do. However, due to the need for sufficient heat exchange between the temperature measuring element and the surrounding medium, it takes a certain amount of time to achieve thermal equilibrium, so the data after reaching a steady state is credible. Based on the above factors, the contact thermal resistance testing method provided by the present invention is specifically realized through the following steps:

[0024] The first step is the preparation ...

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Abstract

The invention discloses thermal contact resistance test equipment, which mainly comprises a bracket, a top plate, a bottom plate, a stress loading device, a data acquisition system and a heating device, wherein the heating device, a test sample and the stress loading device are arranged sequentially from the bottom up between the bottom plate and the top plate; the stress loading device is fixed in the centre of the top plate and adjusts four groups of nuts on the top plate; a stress transfer bar of the stress loading device is in contact with the top end of the test sample to load stress to the top end of the test sample; and the bottom plate adjusts a horizontal angle and a vertical height through the four groups of nuts, and is provided with the heating device used for heating the test sample. The equipment provided by the invention can perform thermal contact resistance test experiments under high temperature and high-contact stress, continuously change the temperature (less than or equal to 1,000 DEG C) of a hot end and adjust the loaded stress (less than or equal to 500 MPa), and simultaneously detect, record, analyze and count the temperatures of monitoring points of a plurality of channels so as to avoid errors caused by the loop record of each channel.

Description

technical field [0001] The invention belongs to the technical field of testing, and specifically relates to a method and equipment for testing thermal contact resistance, which is suitable for testing thermal contact resistance in different temperature and loading stress ranges, and especially capable of testing thermal contact resistance under high temperature and high contact stress conditions condition. Background technique [0002] When the surfaces of two objects come into contact with each other, no matter how smooth the surfaces are, there are always microscopic incomplete contact points. The contact surface of an object is composed of scattered small contact points, which are separated by large gaps, which may be vacuum or filled with heat transfer medium. Therefore, in addition to the inherent thermal resistance at the contact surface, there is an additional heat transfer resistance - contact thermal resistance. Contact resistance is an important parameter in many...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20G01K7/02
Inventor 侯卫国张卫方王宗仁崔本仓唐庆云刘肖丁美丽王晓亮姚婧
Owner BEIHANG UNIV
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