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LED leakage current test method under different wavelengths

A technology of light-emitting diodes and testing methods, applied in the direction of measuring current/voltage, single semiconductor device testing, measuring electricity, etc.

Inactive Publication Date: 2011-01-19
SHANGHAI RES INST OF MICROELECTRONICS SHRIME PEKING UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] At present, there is no solution to meet the test accuracy requirements to test the LED leakage current at different wavelengths

Method used

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  • LED leakage current test method under different wavelengths
  • LED leakage current test method under different wavelengths
  • LED leakage current test method under different wavelengths

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Experimental program
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Embodiment Construction

[0014] exist figure 1 In the schematic diagram shown, the light source 2 is powered by a DC power supply and placed on the lamp holder of the integrating sphere 1, and the LED 3 to be tested is placed on the light outlet of the integrating sphere, which is connected to the TLP test system, and the TLP is connected to the computer. .

[0015] During the test, the entire device is placed in a constant temperature environment. For the LED to be tested, first select the red LED as the light source to irradiate it, and use TLP to measure its leakage current. Then, switch to yellow light, green light, blue light and white light LED light source in turn, and measure the leakage current of the LED DUT.

[0016] This embodiment proposes a test method for LED leakage current under different wavelength conditions. In this method, under constant temperature conditions, the LED to be tested is connected to the TLP test system, and the amplitude is continuously adjustable. detection of i...

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Abstract

The invention provides an LED leakage current test method under different wavelength conditions. The method comprises the following steps of: accessing an LED to be tested to a TLP (Transmission Line Pulse) test system under the condition of constant temperature, and testing the leakage current of the LED through the action of rectangular short pulses with continuous adjustable amplitude. In one embodiment of the invention, an integrating sphere is introduced in order to increase testing accuracy and eliminate the influence of light sources with different shapes in different positions. When light beams enter the integrating sphere, an ideal diffusing source is formed through multiple times of diffuse reflection. Thus, the interference brought by the light sources can be eliminated, and the influence brought by the nonuniformity of the illuminated face of the LED to be tested can be eliminated.

Description

technical field [0001] The invention belongs to the field of semiconductors, in particular to a method for testing leakage currents of light-emitting diodes (LEDs) at different wavelengths by using TLP. Background technique [0002] With the development of microelectronics manufacturing level, LED has become a light source product with a wide range of uses in recent years, and its application range continues to expand. Lighting, display, medical and other fields have put forward strict requirements on the performance of LEDs under various environmental conditions. [0003] Electrostatic damage is one of the main reasons affecting the stability of optoelectronic devices, and LEDs are no exception. At present, the TLP test method has become an important basis for circuit design engineers to study the characteristics of electrostatic discharge (ESD) protection circuits and carry out ESD design. The TLP test starts with a small voltage pulse and increases continuously until en...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/02G01R31/26G01R19/00
Inventor 袁晨严伟
Owner SHANGHAI RES INST OF MICROELECTRONICS SHRIME PEKING UNIV
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