Novel automatic thermoelectric effect testing system and method

A thermoelectric effect and testing system technology, applied in radiation pyrometry, measuring electricity, measuring devices, etc., can solve problems such as single function, thermoelectric effect testing equipment cannot effectively complete thermoelectric effect testing tasks, etc.

Inactive Publication Date: 2018-02-02
CHANGZHOU INST OF TECH
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  • Abstract
  • Description
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  • Application Information

AI Technical Summary

Problems solved by technology

[0005] A variety of requirements lead to the thermoelectric effect test equipment with a single function cannot effectively complete the thermoelectric effect test task

Method used

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  • Novel automatic thermoelectric effect testing system and method
  • Novel automatic thermoelectric effect testing system and method
  • Novel automatic thermoelectric effect testing system and method

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Experimental program
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Embodiment Construction

[0043] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0044] The invention provides an integrated system and method of multiple signal generating modules. The transmission line pulse generator is used to generate shock pulses with a pulse width between 100 ps and 100 ns, the long pulse generator is used to generate shock pulses with a pulse width above microsecond level, and the AC signal generator is used to generate AC signals.

[0045] The present invention also provides an integrated system and method for integrating multiple pyroelectric effect detection modules, including but not limited to temperature control and monitoring devices, IV detection devices, CV detection devices, and infrared imaging devices. The temperature control and monitoring device can change the ambient temperature of the components and also detect the ambient temperature of the components, so as to meet the temperature control and det...

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Abstract

The present invention discloses a novel automatic thermoelectric effect testing system and method. The system integrates a variety of signal generation modules and comprises a transmission line pulsegenerator, a long pulse generator and an AC signal generator. The system integrates a variety of thermoelectric effect detection modules and comprises a temperature control and monitoring devices, anIV detection device, a CV detection device and an infrared imaging device. The system integrates a variety of signal generation modules and a variety of pyroelectric effect detection modules, the signal generation modules produce shock pulses with flexible and adjustable pulse widths, pulse intervals and pulse voltage amplitudes within a range of 100ps to 100ns by using a transmission line system,or a signal generator generates a long pulse or AC signal, and multiple component testing needs are satisfied. The thermoelectric effect detection modules have multiple thermoelectric effect detection means including the detection of temperature, IV, CV and infrared parameters in a thermoelectric effect test. The system is a semiconductor component thermoelectric effect testing system with an automatic characteristic.

Description

technical field [0001] The invention relates to the field of semiconductor thermoelectric effect testing, in particular to a novel automatic system and method for measuring the thermoelectric effect of semiconductor components integrated with multiple signal generation modules and multiple thermoelectric effect detection modules. Background technique [0002] For electronic components, the operating temperature has a great influence on the performance of components. Electronic components have a certain power, and the internal or external temperature of the components will change with the accumulation of heat in the working state, and the temperature change will in turn affect the working state of the components, that is, the thermoelectric coupling phenomenon. The most direct example is that for bipolar transistors, the accumulation of heat makes the internal temperature of the bipolar transistor rise, and the current increases with the increase of the internal temperature, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01J5/00
Inventor 姜一波董良威翟明静鲍静益葛云飞王玥汤洪波
Owner CHANGZHOU INST OF TECH
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