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X-ray diagnostic apparatus

A diagnostic device and X-ray technology, which is applied in the direction of diagnosis, radiological diagnostic instruments, measuring devices, etc., and can solve the problem of X-ray detection components becoming defective components, etc.

Inactive Publication Date: 2013-05-29
HITACHI LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] There is a high possibility of defective elements among the multiple X-ray detection elements constituting the X-ray flat surface detector
In addition, there are also cases where the X-ray detection element becomes a defective element later

Method used

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Experimental program
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Effect test

no. 1 approach

[0026] (First embodiment: counting of blocks)

[0027] Hereinafter, the first embodiment will be described with reference to the drawings. figure 1 The overall structure of the X-ray diagnostic apparatus is shown in . The X-ray apparatus in this embodiment includes: an X-ray generator 10 for irradiating X-rays to a subject 12, and an X-ray plane detector for detecting transmitted X-rays of the subject 12, which is disposed opposite to the X-ray generator 12. The detector 14, the signal processing unit 20 for grasping the degree of agglomeration of defective pixels based on the X-ray information obtained from the X-ray plane detector 14, and the display unit 34 for displaying the state of the X-ray plane detector 14.

[0028] The X-ray generator 10 has, for example, an X-ray tube composed of a cathode emitting thermal electrons and an anode receiving electrons to generate X-rays. The X-rays generated by the X-ray generator 10 are irradiated to the subject 12 . The X-ray plan...

no. 2 approach

[0043] (Second embodiment: continuous)

[0044] use Figure 1-6 Describes the second embodiment. The difference from the first embodiment is that whether the X-ray plane detector 14 is abnormal is judged based on the continuous state of defective pixels corresponding to defective elements. The selection unit 304 in this embodiment selects the continuous number counting unit 302 .

[0045] The continuous number counting unit 302 of the degree of agglomeration detection unit 32 is based on the position of the defective pixel of the X-ray image data 50 stored in the defective pixel position storage unit 28, and counts the positions of the defective pixels adjacent to the upper, lower, left and right Counting is performed continuously to detect the continuous status of defective components.

[0046] For example, for the defective pixel (1, 1), since there is no adjacent defective pixel above, below, left, or right, the consecutive number counting unit 302 counts as the consecut...

no. 3 approach

[0051] (Third embodiment: block count+continuation)

[0052] use Figure 1-6 A third embodiment will be described. The difference from the first embodiment and the second embodiment is that whether the X-ray plane detector 14 is abnormal is judged based on the block number and the continuous number of defective pixels corresponding to the defective element. The selecting section 304 in this embodiment selects the block number counting section 301 and the continuous number counting section 302 .

[0053] As described in the first embodiment, the block number counting unit 301 counts the position information of all defective pixels judged as defective components based on the position information of the X-ray image data 50 stored in the defective pixel position storage unit 28, Defective pixels are counted, and the continuous number counting unit 302 is based on the position of the defective pixel in the X-ray image data 50 stored in the defective pixel position storage unit 28...

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Abstract

Provided is an X-ray diagnostic apparatus capable of appropriately grasping the state of a defective element of an X-ray plane detector. The X-ray diagnostic apparatus, provided with an X-ray generator (10) equipped with an X-ray tube, an X-ray plane detector (14) disposed opposite to the X-ray generator (10), an image processing means (24) for performing image processing on the basis of X-ray image data read from the X-ray plane detector (14), and a display means (34) for displaying an X-ray image or a perspective image subjected to the image processing, is provided with a defective pixel detecting means (26) for detecting a defective pixel corresponding to a defective element of the X-ray plane detector (14) from pixel information of the X-ray image data and an abnormality judging means (32) for detecting the clustering degree of defective elements of the X-ray plane detector (14) on the basis of the detected defective pixel and defective pixels therearound and judging whether or not the X-ray plane detector is abnormal.

Description

technical field [0001] The present invention relates to an X-ray diagnostic device equipped with an X-ray plane detector, and more particularly to an X-ray diagnostic device for detecting the state of a defective element of the X-ray plane detector. Background technique [0002] The X-ray diagnostic apparatus obtains X-ray image data of the subject by irradiating the subject with X-rays and detecting the transmitted X-rays with an X-ray plane detector. In addition, the X-ray diagnostic apparatus displays X-ray images or fluoroscopic images on a display unit by processing X-ray image data with an image processing unit. [0003] There is a high possibility that a defective element exists among a plurality of X-ray detection elements constituting the X-ray plane detector. In addition, there are also cases where the X-ray detection element becomes a defective element later. Therefore, conventionally, defective elements of an X-ray plane detector are detected based on preclinic...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B6/00G01T1/20G01T1/24
CPCA61B6/583G01T1/2928A61B6/585
Inventor 竹之内忍铃木克己
Owner HITACHI LTD
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