Semiconductor device test system, test handler, and test head, interface block for semiconductor device tester, method for classifying tested semiconductor device and method for supporting semiconductor device test

Abstract

A semiconductor device test system and a test handler are disclosed. A temperature control apparatus is installed to an interface block of a test head and removes heat generated from a testing board. Therefore, the testing of semiconductor devices can be performed with a high degree of reliability.

Description

Technical field [0001] The present invention relates to a semiconductor element testing system and a test processor, and more particularly to a technology in which the interface block of a test head for testing semiconductor elements is provided with a test board for performing testing of semiconductor elements. Background technique [0002] Generally speaking, a semiconductor component test system includes: a test control device; a test head for testing semiconductor components under the control of the test control device; a test processor that provides a plurality of semiconductor components to the test head and makes The semiconductor element can be electrically connected to the test head to allow multiple semiconductor elements to be tested at the same time; the supporting device supports the test head so that the test head can be stably connected to the test processor. This supporting device is also called a "controller" in the technical field of the present invention. [000...

AI Technical Summary

Problems solved by technology

If the operating temperature of the test chip exceeds 60°C, it may cause malfunction

Therefore, testing of semiconductor components cannot be reliably performed at high temperatures

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