Semiconductor device test system, test handler, and test head, interface block for semiconductor device tester, method for classifying tested semiconductor device and method for supporting semiconductor device test
A component testing and semiconductor technology, applied in the direction of semiconductor/solid-state device testing/measurement, single semiconductor device testing, etc., can solve problems such as failures, and achieve the effect of preventing test errors, accurate testing, and ensuring reliability
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
example 1
[0150] The closed space S can be notified of overheating through the test processor. Here, the notification method may be to generate an audible alarm or display it visually through the display of the test processor.
example 2
[0152] The work of the test processor can be temporarily stopped. Preferably, after the temperature of the enclosed space S returns to the required temperature range, the stop of the test processor is automatically released.
example 3
[0154] The semiconductor components tested when overheating occurs in the enclosed space S are classified by retest batches.
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com